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These N-Channel enhancement mode power field effect transistors are produced using Fairchild's proprietary, high cell density, DMOS technology. This very high density process is especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulses in the avalanche and commutation modes. These devices are particularly suited for low voltage applications such as automotive, DC/DC converters, PWM motor controls, and other battery powered circuits where fast switching, low in-line power loss, and resistance to transients are needed.
NDB7050 Maximum Ratings
Symbol
Parameter
NDP7050
NDB7050
Units
VDSS
Drain-Source Voltage
50
V
VDGR
Drain-Gate Voltage (RGS < 1 M)
50
V
VDSS
Gate-Source Voltage - Continuous - Nonrepetitive (tP < 50 s)
± 20
V
± 40
ID
Drain Current - Continuous - Pulsed
75
A
225
PD
Total Power Dissipation @ TC = 25°C Derate above 25°C
150
W
1
W/
TJ,TSTG
Operating and Storage Temperature
-65 to 175
TL
Maximum lead temperature for soldering purposes, 1/8" from case for 5 seconds
275
NDB7050 Features
`75A, 50V. RDS(ON) = 0.013 @ VGS=10V. `Critical DC electrical parameters specified at elevated temperature. `Rugged internal source-drain diode can eliminate the need for an external Zener diode transient suppressor. `175°C maximum junction temperature rating. `High density cell design for extremely low RDS(ON). `TO-220 and TO-263 (D2PAK) package for both through hole and surface mount applications.