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FSF450D3, FSF450R, FSF450R1

Table of contents:
Info of FSF450D3
Info of FSF450R
Info of FSF450R1

FSF450D3, FSF450R, FSF450R1 Selling Leads, Datasheet

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FSF450D3, FSF450R, FSF450R1 Datasheet download

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FSF450R General Description

The Discrete Products Operation of Intersil Corporation has developed a series of Radiation Hardened MOSFETs specifically designed for commercial and military space applications. Enhanced Power MOSFET immunity to Single Event Effects (SEE), Single Event Gate Rupture (SEGR) in particular, is combined with 100K RADS of total dose hardness to provide devices which are ideally suited to harsh space environments. The dose rate and neutron tolerance necessary for military applications have not been sacrificed.

The Intersil portfolio of SEGR resistant radiation hardened MOSFETs includes N-Channel and P-Channel devices in a variety of voltage, current and on-resistance ratings.umerous packaging options are also available.

This MOSFET is an enhancement-mode silicon-gate powerfield-effect transistor of the vertical DMOS (VDMOS) structure. It is specially designed and processed to be radiation tolerant. The MOSFET is well suited for applications exposed to radiation environments such as switching regulation, switching converters, motor drives, relay drivers and drivers for high-power bipolar switching transistors requiring high speed and low gate drive power. This type can be operated directly from integrated circuits.

Reliability screening is available as either commercial, TXV equivalent of MIL-S-19500, or Space equivalent of MIL-S-19500. Contact Intersil for any desired deviations from the data sheet.

FSF450R Maximum Ratings

		FSF450D, FSF450R	UNITS
Drain-Source Voltage	V_DS	500	V
Drain-Gate Voltage (R_GS = 20k).	V_DGR	500	V
Continuous Drain Current T_C = 25 T_C = 100	I_D I_D	9 6	A A
Pulsed Drain Current	I_DM	27	A
Gate-Source Voltage	V_GS	±20	V
Maximum Power Dissipation T_C= 25 T_C = 100	P_T P_T	125 50	W W
Linear Derating Factor		1.00	W/
Single Pulsed Avalanche Current,L = 100H, (See Test Figure)	I_AS	27	A
Continuous Source Current (Body Diode)	I_S	9	A
Pulsed Source Current (Body Diode)	I_SM	27	A
Operating And Storage Temperature	T_J, T_STG	-55 to +150
Lead Temperature (During Soldering) Distance > 0.063 in. (1.6mm) From Case, 10s Max	T_L	300

CAUTION: Stresses above those listed in "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.

FSF450R Features

• 9A, 500V, r_DS(ON) = 0.600
• Total Dose
   - Meets Pre-RAD Specifications to 100K RAD (Si)
• Single Event
   - Safe Operating Area Curve for Single Event Effects
   - SEE Immunity for LET of 36MeV/mg/cm² with V_DS up to 80% of Rated Breakdown and V_GS of 10V Off-Bias
• Dose Rate
   - Typically Survives 3E9 RAD (Si)/s at 80% BVDSS
   - Typically Survives 2E12 if Current Limited to IDM
• Photo Current
   - 30nA Per-RAD(Si)/s Typically
• Neutron
   - Maintain Pre-RAD Specifications for 3E12 Neutrons/cm²
   - Usable to 3E13 Neutrons/cm²

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