GT10J301, GT10J303, GT10J311 Selling Leads, Datasheet
MFG:TOS Package Cooled:TO-3P D/C:N.A
GT10J301, GT10J303, GT10J311 Datasheet download
Part Number: GT10J301
MFG: TOS
Package Cooled: TO-3P
D/C: N.A
MFG:TOS Package Cooled:TO-3P D/C:N.A
GT10J301, GT10J303, GT10J311 Datasheet download
MFG: TOS
Package Cooled: TO-3P
D/C: N.A
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PDF/DataSheet Download
Datasheet: GT10J301
File Size: 329046 KB
Manufacturer: TOSHIBA [Toshiba Semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: GT10J303
File Size: 298572 KB
Manufacturer: TOSHIBA [Toshiba Semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: GT10J311
File Size: 330644 KB
Manufacturer: TOSHIBA [Toshiba Semiconductor]
Download : Click here to Download
Characteristics |
Symbol |
Rating |
Unit | |
Collector−Emitter Voltage |
VCES |
600 |
V | |
Gate−Emitter Voltage |
VGES |
±20 |
V | |
Collector Current | DC |
IC |
10 |
A |
1ms |
ICP |
20 |
A | |
Emitter−Collector Forward Current |
DC |
IF |
10 |
A |
1ms |
IFM |
20 |
A | |
Collector Power Dissipation (Tc = 25) |
PC |
90 |
W | |
Junction temperature |
Tj |
150 |
||
Storage temperature range |
Tstg |
-55~150 |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
CHARACTERISTIC |
SYMBOL |
RATING |
UNIT | |
Collector−Emitter Voltage |
VCES |
600 |
V | |
Gate-Emitter Voltage |
VGES |
±20 |
V | |
Collector Current |
DC |
IC |
10 |
A |
1ms |
ICP |
20 |
A | |
Emitter−Collector Forward Current |
DC |
IF |
10 |
A |
1ms |
IFM |
20 |
A | |
Collector Power Dissipation (Tc = 25°C) |
PC |
30 |
W | |
Junction Temperature |
Tj |
150 |
||
Storage Temperature Range |
Tstg |
−55~150 |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).