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The TSEV8308500GL Evaluation Board (EB) is a prototype board which has beendesigned in order to facilitate the evaluation and the characterization of the TS8308500GL device (in CBGA68) up to its 1.3 GHz full analog power bandwidth atup to 500 Msps in the extended temperature range.
The high speed sampling rate of the TS8308500GL requires careful attention to circuitdesign and layout to achieve optimal performance. This four metal layer board withinternal ground plane has the adequate functions in order to allow a quick and simpleevaluation of the TS8308500GL ADC performances over the temperature range.
The TS8308500GL Evaluation Board (EB) is very straightforward as it only imple-ments the TS8308500GL ADC device, SMA connectors for input/output accesses anda 2.54 mm pitch connector compatible with standard high frequency probes.
The board also implements a de-embedding fixture in order to facilitate the evaluationof the high frequency insertion loss of the inputs microstrip lines, and a die junctiontemperature measurement setting.
The board is constituted by a sandwich of two dielectriclayers, featuring low insertionloss and enhanced thermal characteristics for operation in the high frequency domainand extended temperature range.
The board dimensions are 130 mm x 130 mm.
The board set comes fully assembled and tested, with the TS8308500GL installedand heatsink.
TSEV8308500GL Maximum Ratings
Parameter
Symbol
Comments
Values
Unit
Positive supply voltage
VCC
GND to 6
V
Digital negative supply voltage
DVEE
GND to -5.7
V
Digital positive supply voltage
VPLUSD
GND -0.3 to 2.8
V
Negative supply voltage
VEE
VGND to -6
V
Maximum difference between negative supply voltage