TSEV8308500GL

Specifications Parameter Symbol Comments Values Unit Positive supply voltage VCC GND to 6 V Digital negative supply voltage DVEE GND to -5.7 V Digital positive supply voltage VPLUSD GND -0.3 to 2.8 V Negative supply ...

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SeekIC No. : 004529388 Detail

TSEV8308500GL: Specifications Parameter Symbol Comments Values Unit Positive supply voltage VCC GND to 6 V Digital negative supply voltage DVEE GND to -5.7 ...

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Part Number:
TSEV8308500GL
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/12/19

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Product Details

Description



Specifications

Parameter

Symbol

Comments

Values

Unit

Positive supply voltage

VCC

 

GND to 6

V

Digital negative supply voltage

DVEE

 

GND to -5.7

V

Digital positive supply voltage

VPLUSD

 

GND -0.3 to 2.8

V

Negative supply voltage

VEE

 

VGND to -6

V

Maximum difference between negative supply voltage

DVEE to VEE

 

0.3

V

Analog input voltages

VIN or VINB

 

-1 to +1

V

Maximum difference between VIN and VINB

VIN - VINB

 

-2 to +2

V

Digital input voltage

VD

GORB

-0.3 to VCC +0.3

V

Digital input voltage

VD

DRRB

VEE
-0.3 to +0.9

V

Digital output voltage

VO

 

VPLUSD
-3 to VPLUSD
-0.5

V

Clock input voltage

VCLK or VCLKB

 

-3 to +1.5

V

Maximum junction temperature

VCLK - VCLKB

 

-2 to +2

V

Junction temperature

TJ

 

+145

°C

Storage temperature

Tstg

 

- 65to + 150

°C

Lead temperature (soldering 10s)

Tleads

 

+300

°C




Description

The TSEV8308500GL Evaluation Board (EB) is a prototype board which has beendesigned in order to facilitate the evaluation and the characterization of the
TS8308500GL device (in CBGA68) up to its 1.3 GHz full analog power bandwidth atup to 500 Msps in the extended temperature range.

The high speed sampling rate of the TSEV8308500GL requires careful attention to circuitdesign and layout to achieve optimal performance. This four metal layer board withinternal ground plane has the adequate functions in order to allow a quick and simpleevaluation of the TSEV8308500GL ADC performances over the temperature range.

The TSEV8308500GL Evaluation Board (EB) is very straightforward as it only imple-ments the TSEV8308500GL ADC device, SMA connectors for input/output accesses anda 2.54 mm pitch connector compatible with standard high frequency probes.

The TSEV8308500GL also implements a de-embedding fixture in order to facilitate the evaluationof the high frequency insertion loss of the inputs microstrip lines, and a die junctiontemperature measurement setting.

The TSEV8308500GL is constituted by a sandwich of two dielectriclayers, featuring low insertionloss and enhanced thermal characteristics for operation in the high frequency domainand extended temperature range.

The TSEV8308500GL dimensions are 130 mm x 130 mm.

The TSEV8308500GL set comes fully assembled and tested, with the TS8308500GL installedand heatsink.




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