TPCS8007-H

Features: • Low drain-source ON-resistance: RDS (ON) = 0.36 (typ.)• High forward transfer admittance: |Yfs| = 2.1 S (typ.)• Low leakage current: IDSS = 100 A (max) (VDS = 200 V)• Enhancement model: Vth = 2.0~4.0 V (VDS = 10 V, ID = 1 mA)Specifications Characteristic ...

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SeekIC No. : 004526238 Detail

TPCS8007-H: Features: • Low drain-source ON-resistance: RDS (ON) = 0.36 (typ.)• High forward transfer admittance: |Yfs| = 2.1 S (typ.)• Low leakage current: IDSS = 100 A (max) (VDS = 200 V)&#...

floor Price/Ceiling Price

Part Number:
TPCS8007-H
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/1

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Product Details

Description



Features:

• Low drain-source ON-resistance: RDS (ON) = 0.36 (typ.)
• High forward transfer admittance: |Yfs| = 2.1 S (typ.)
• Low leakage current: IDSS = 100 A (max) (VDS = 200 V)
• Enhancement model: Vth = 2.0~4.0 V (VDS = 10 V, ID = 1 mA)



Specifications

Characteristic Symbol Value Units
Drain-source voltage VDSS 200 V
Drain-gate voltage (RGS = 20 k) VDGR 200 V
Gate-source voltage VGSS ±20 V
Drain current DC (Note 1)

Pulse (Note 1)
ID

IDP
1.9

7.6
A
Drain power dissipation (t = 10 s)
(Note 2a)
Drain power dissipation (t = 10 s)
(Note 2b)
PD

PD
1.5
0.6
W
Single-pulse avalanche energy(Note3) EAS 2.3 mJ
Avalanche current IAR 1.9 A
Repetitive avalanche energy
(Note2a, Note 4)
EAR 0.15 mJ
Channel temperature Tch 150
Storage temperature rangee TSTG - 55 to +150


Note: For Notes 1 to 4, refer to the next page.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling  recautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).

This transistor is an electrostatic-sensitive device. Handle with care.




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