Features: Q1Low Forward Voltage Drop : VF(3)=0.98V(typ.)Fast Reverse Recovery Time : trr=1.6ns(typ.)Low Total Capacitance : CT=0.5pF(typ.)Q2High DC Current Gain : hFE=600~3600High Voltage : VCEO=50VHigh Collector Current : IC=150mA(max.)Q1 (Diode) : 1SS352 EquivalentQ2 (Transistor) : 2SC4666 Equiv...
HN2E01F: Features: Q1Low Forward Voltage Drop : VF(3)=0.98V(typ.)Fast Reverse Recovery Time : trr=1.6ns(typ.)Low Total Capacitance : CT=0.5pF(typ.)Q2High DC Current Gain : hFE=600~3600High Voltage : VCEO=50V...
SeekIC Buyer Protection PLUS - newly updated for 2013!
268 Transactions
All payment methods are secure and covered by SeekIC Buyer Protection PLUS.
Q1 (Diode)
Characteristic |
Symbol |
Rating |
Unit |
Maximum (peak) reverse voltage |
VRM |
85 |
V |
Reverse voltage |
VR |
80 |
V |
Maximum (peak) forward current |
IFM |
300 |
mA |
Average forward current |
IO |
100 |
mA |
Surge current (10ms) |
IFSM |
1 |
A |
Characteristic |
Symbol |
Rating |
Unit |
Collector-base voltage |
VCBO |
50 |
V |
Collector-emitter voltage |
VCEO |
50 |
V |
Emitter-base voltage |
VEBO |
5 |
V |
Collector current |
IC |
150 |
mA |
Base current |
IB |
30 |
mA |
Characteristic |
Symbol |
Rating |
Unit |
Collector power dissipation |
PC* |
300 |
mW |
Junction temperature |
Tj |
125 |
|
Storage temperature range |
Tstg |
−55~125 |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook "Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
* Total rating: 200mW per element should not be exceeded.