NLSF3T126MNR2, NLSF595, NLSFT125NMR2 Selling Leads, Datasheet
MFG:ON Package Cooled:QFN-16 D/C:08+
NLSF3T126MNR2, NLSF595, NLSFT125NMR2 Datasheet download
Part Number: NLSF3T126MNR2
MFG: ON
Package Cooled: QFN-16
D/C: 08+
MFG:ON Package Cooled:QFN-16 D/C:08+
NLSF3T126MNR2, NLSF595, NLSFT125NMR2 Datasheet download
MFG: ON
Package Cooled: QFN-16
D/C: 08+
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PDF/DataSheet Download
Datasheet: NLSF1174
File Size: 30640 KB
Manufacturer: ON SEMICONDUCTOR
Download : Click here to Download
PDF/DataSheet Download
Datasheet: NLSF595
File Size: 133725 KB
Manufacturer: ONSEMI [ON Semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: NLSF1174
File Size: 30640 KB
Manufacturer: ON SEMICONDUCTOR
Download : Click here to Download
The NLSF595 is advanced CMOS shift register with open drain outputs fabricated with 0.6 m silicon gate CMOS technology. This device is used in conjunction with a microcontroller, with only onededicated line. All pins have Overvoltage Protection that allows voltages above VCC up to 7.0 V to be present on the pins without damage or disruption of operation of the part, regardless of the operating voltage. This device may be used between 2.0 and 5.5 volts, the output driver level may be independent of supply voltage: 0−7.0 volts.
Symbol | Parameter | Value | Unit |
VCC | Positive DC Supply Voltage | -0.5 to +7.0 | V |
VIN | DC Input Voltage | -0.5 to +7.0 | V |
VOUT | DC Output Voltage | -0.5 to VCC +7.0 | V |
IIk | Input Diode Current | -20 | mA |
IOK | Output Diode Current | ±50 | mA |
IOUT | DC Output Current,per Pin | ±50 | mA |
ICC | DC Supply Current,VCC and GND Pins | ±75 | mA |
PD | Power Dissipation in Still Air | 450 | mW |
TSTG | Storage Temperature Range | -65 to +150 | |
ILATCHUP | Latchup Performance Above VCC and Below GND at 125°C (Note | ±300 | mA |
JA | Thermal Resistance, Junction−to−Ambient | 128 | /W |
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected.
1. Tested to EIA/JESD78