MFG:ON Semiconductor Category:Integrated Circuits (ICs) Package Cooled:QFN-24 D/C:O9+
NB4N441MNG, NB4N507A, NB4N507AD Datasheet download
Category: Integrated Circuits (ICs)
MFG: ON Semiconductor
Package Cooled: QFN-24
D/C: O9+
Description: IC SYNTH PLL CLK LVPECL 24-QFN
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PDF/DataSheet Download
Datasheet: NB4L16M
File Size: 41662 KB
Manufacturer: ON SEMICONDUCTOR
Download : Click here to Download
PDF/DataSheet Download
Datasheet: NB4N507A
File Size: 134578 KB
Manufacturer: ETC [ETC]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: NB4L16M
File Size: 41662 KB
Manufacturer: ON SEMICONDUCTOR
Download : Click here to Download
| Technical/Catalog Information | NB4N441MNG |
| Vendor | ON Semiconductor |
| Category | Integrated Circuits (ICs) |
| Type | Clock Synthesizer |
| Voltage - Supply | 3.135 V ~ 3.465 V |
| Number of Outputs | 1 |
| Input | LVCMOS, LVTTL |
| Output | LVPECL |
| Frequency-Max | 425MHz |
| Package / Case | 24-QFN |
| Packaging | Tube |
| Operating Temperature | -40°C ~ 85°C |
| Drawing Number | * |
| Lead Free Status | Lead Free |
| RoHS Status | RoHS Compliant |
| Other Names | NB4N441MNG NB4N441MNG |
The NB4N507A is a precision clock synthesizer which generates a very low jitter differential PECL output clock. It produces a clock output based on an integer multiple of an input reference frequency.
The NB4N507A accepts a standard fundamental mode crystal, using Phase−Locked−Loop (PLL) techniques, will produce output clocks up to 200 MHz. In addition, the PLL circuitry will produce a 50% duty cycle square−wave clock output.
The NB4N507A can be programmed to generate a selection of input reference frequency multiples. An exact 155.52 MHz output clock can be generated from a 19.44 MHz crystal and the x8 multiplier selection. The NB4N507A is intended for low output jitter clock generation.
|
Symbol |
Parameter | Condition 1 | Condition 2 |
Rating |
Unit |
|
VCC |
Positive Power Supply | GND = 0 V |
6 |
V | |
|
VI |
Positive Input |
GND − 0.5 VI VDD + 0.5 |
V | ||
|
TA |
Operating Temperature Range |
−40 to +85 |
|||
|
Tstg |
Storage Temperature Range |
−65 to +150 |
|||
|
JA |
Thermal Resistance (Junction−to−Ambient) | 0 lfpm 500 lfpm |
SOIC−16 |
100 60 |
/W /W |
|
JC |
Thermal Resistance (Junction−to−Case) | (Note 2) | SOIC−16 |
33 to36 |
/W |
|
Tsol |
Wave Solder Pb Pb−Free |
<3 Sec @ 248°C <3 Sec @ 260°C |
265 |
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected.
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