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ProASIC3, the third-generation family of Actel Flashb PGAs, offers performance, density, and features beyond those of the ProASICPLUS® family. The nonvolatile Flash technology gives ProASIC3 devices the advantage of being a secure, low-power, single-chip solution that is live at power-up. ProASIC3 is reprogrammable and offers time-to-market benefits at an ASIC-level unit cost. These features enable designers to create high-density systems using existing ASIC or FPGA design flows and tools.
ProASIC3 devices offer 1 kbit of on-chip, user nonvolatile FlashROM (FROM) memory storage as well as clock conditioning circuitry based on an integrated phaselocked loop (PLL). The A3P030 device has no PLL or RAM support. ProASIC3 devices have up to 1 million system gates, supported with up to 144 kbits of true dual-port SRAM and up to 288 user I/Os.
A3P060 Features
Features and Benefits High-Temperature AEC-Q100Qualified Devices • Grade 2 105°C TA (115°C TJ) • Grade 1 125°C TA (135°C TJ) • PPAP Documentation Firm-Error Immune • Only Automotive FPGAs to Offer Firm-Error Immunity • Can Be Used without Configuration Upset Risk High Capacity • 60 k to 1 M System Gates • Up to 144 kbits of SRAM • Up to 300 User I/Os Reprogrammable Flash Technology • 130-nm, 7-Layer Metal (6 Copper), Flash-Based CMOS Automotive Process • Live-at-Power-Up (LAPU) Level 0 Support • Single-Chip Solution • Retains Programmed Design when Powered Off On-Chip User Nonvolatile Memory • 1 kbit of FlashROM with Synchronous Interface High Performance • 350 MHz System Performance • 3.3 V, 66 MHz 64-Bit PCI In-System Programming (ISP) and Security • Secure ISP Using On-Chip 128-Bit Advanced Encryption Standard (AES) Decryption via JTAG (IEEE 1532compliant) • FlashLock® to Secure FPGA Contents (anti-tampering) Low Power • 1.5 V Core Voltage • Support for 1.5-V-Only Systems • Low-Impedance Flash Switches High-Performance Routing Hierarchy • Segmented, Hierarchical Routing and Clock Structure • High-Performance, Low-Skew Global Network • Architecture Supports Ultra-High Utilization Advanced I/O • 700 Mbps DDR, LVDS-Capable I/Os • 1.5 V, 1.8 V, 2.5 V, and 3.3 V Mixed-Voltage Operation • Bank-Selectable I/O Voltages-up to 4 Banks per Chip • Single-Ended I/O Standards: LVTTL, LVCMOS 3.3 V / 2.5 V / 1.8 V / 1.5 V, 3.3 V PCI / 3.3 V PCI-X, and LVCMOS 2.5 V / 5.0 V Input • Differential I/O Standards: LVPECL, LVDS, B-LVDS, and M-LVDS (A3P250 and A3P1000) • I/O Registers on Input, Output, and Enable Paths • Hot-Swappable and Cold-Sparing I/Os • Programmable Output Slew Rate and Drive Strength • Weak Pull-Up/-Down • IEEE 1149.1 (JTAG) Boundary Scan Test • Pin-Compatible Packages across the Automotive ProASIC®3 Family Clock Conditioning Circuit (CCC) and PLL • Six CCC Blocks, One with an Integrated PLL • Configurable Phase Shift, Multiply/Divide, Delay Capabilities, and External Feedback • Wide Input Frequency Range (1.5 MHz up to 350 MHz) SRAMs • Variable-Aspect-Ratio 4,608-Bit RAM Blocks