2SJ103-Y, 2SJ104, 2SJ105 Selling Leads, Datasheet
MFG:TOS Package Cooled:TO-92 D/C:06+
2SJ103-Y, 2SJ104, 2SJ105 Datasheet download
Part Number: 2SJ103-Y
MFG: TOS
Package Cooled: TO-92
D/C: 06+
MFG:TOS Package Cooled:TO-92 D/C:06+
2SJ103-Y, 2SJ104, 2SJ105 Datasheet download
MFG: TOS
Package Cooled: TO-92
D/C: 06+
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PDF/DataSheet Download
Datasheet: 2SJ0163
File Size: 48479 KB
Manufacturer: PANASONIC [Panasonic Semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: 2SJ104
File Size: 213830 KB
Manufacturer: TOSHIBA [Toshiba Semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: 2SJ105
File Size: 190433 KB
Manufacturer: TOSHIBA [Toshiba Semiconductor]
Download : Click here to Download
Characteristics |
Symbol |
Rating |
Unit |
Gate-drain voltage Gate current Drain power dissipation Junction temperature Storage temperature range |
VGDS IG PD Tj Tstg |
25 -10 400 125 -55~125 |
V mA mW |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Conce and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Characteristics | Symbol | Rating | Unit |
Gate-drain voltage | VGDS | 50 | V |
Gate current | IG | -10 | mA |
Drain power dissipation | PD | 200 | mW |
Junction temperature | Tj | 125 | |
Storage temperature range | Tstg | ?55~125 |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).