22L4, 22LB, 22LV10 Selling Leads, Datasheet
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22L4, 22LB, 22LV10
- Table of contents:
Info of 22L4
Info of 22LB
Info of 22LV10
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About 22LV10AZ-25
PDF/DataSheet Download
Datasheet: 22LV10AZ-25
File Size: 142585 KB
Manufacturer: ETC
Download : Click here to Download
About 22LV10AZ-25
PDF/DataSheet Download
Datasheet: 22LV10AZ-25
File Size: 142585 KB
Manufacturer: ETC
Download : Click here to Download
About 22LV10AZ-25
PDF/DataSheet Download
Datasheet: 22LV10AZ-25
File Size: 142585 KB
Manufacturer: ETC
Download : Click here to Download
22LV10 General Description
The ispGAL22LV10 is manufactured using Lattice Semiconductor's advanced 3.3V E2CMOS process, which combines CMOS with Electrically Erasable (E2) floating gate technology. The ispGAL22LV10 can interface with both 3.3V and 5V signal levels.
The ispGAL22LV10 is fully function/fuse map compatible with the GAL®22LV10 and GAL22V10. Further, the ispGAL22LV10 is parametric compatible with the GAL22LV10. The ispGAL22LV10 also shares the same 28-pin PLCC package pin-out as the GAL22LV10.
Unique test circuitry and reprogrammable cells allow complete AC, DC, and functional testing during manufacture. As a result, Lattice Semiconductor delivers 100% field programmability and functionality of all GAL products. In addition, 10,000 erase/write cycles and data retention in excess of 20 years are specified.
22LV10 Maximum Ratings
Commercial Devices:
Ambient Temperature (TA) .......................... 0 to 75°C
Supply voltage (VCC)
with Respect to Ground ......................... +3.0 to +3.6V
Industrial Devices:
Ambient Temperature (TA) ....................... -40 to 85°C
Supply voltage (VCC)
with Respect to Ground ......................... +3.0 to +3.6V
Supply voltage VCC ................................ -0.5 to +4.6V
Input and I/O voltage applied................. -0.5 to +5.6V
Off-state output voltage applied ............ -0.5 to +4.6V
Storage Temperature ................................. -65 to 150°C
Ambient Temperature with
Power Applied ......................................... -55 to 125°C
1.Stresses above those listed under the "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress only ratings and functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications).
22LV10 Features
• IN-SYSTEM PROGRAMMABLE
- IEEE 1149.1 Standard TAP Controller Port Programming
- 4-Wire Serial Programming Interface
- Minimum 10,000 Program/Erase Cycles
• HIGH PERFORMANCE E2CMOS® TECHNOLOGY
- 4 ns Maximum Propagation Delay
- Fmax = 250 MHz
- 3 ns Maximum from Clock Input to Data Output
- UltraMOS® Advanced CMOS Technology
• 3.3V LOW VOLTAGE 22V10 ARCHITECTURE
- JEDEC-Compatible 3.3V Interface Standard
- 5V Tolerant Inputs and I/O
- I/O Interfaces with Standard 5V TTL Devices
• ACTIVE PULL-UPS ON ALL LOGIC INPUT AND I/O PINS
• COMPATIBLE WITH STANDARD 22LV10/22V10 DEVICES
- Function/Fuse-Map Compatible with 22LV10/22V10 Devices
- Parametric Compatible with 22LV10
• E2 CELL TECHNOLOGY
- In-System Programmable Logic
- 100% Tested/100% Yields
- High Speed Electrical Erasure (<100ms)
- 20 Year Data Retention
• APPLICATIONS INCLUDE:
- DMA Control
- State Machine Control
- High Speed Graphics Processing
- Software-Driven Hardware Configuration
• ELECTRONIC SIGNATURE FOR IDENTIFICATION
- IEEE 1149.1 Standard TAP Controller Port Programming
- 4-Wire Serial Programming Interface
- Minimum 10,000 Program/Erase Cycles
• HIGH PERFORMANCE E2CMOS® TECHNOLOGY
- 4 ns Maximum Propagation Delay
- Fmax = 250 MHz
- 3 ns Maximum from Clock Input to Data Output
- UltraMOS® Advanced CMOS Technology
• 3.3V LOW VOLTAGE 22V10 ARCHITECTURE
- JEDEC-Compatible 3.3V Interface Standard
- 5V Tolerant Inputs and I/O
- I/O Interfaces with Standard 5V TTL Devices
• ACTIVE PULL-UPS ON ALL LOGIC INPUT AND I/O PINS
• COMPATIBLE WITH STANDARD 22LV10/22V10 DEVICES
- Function/Fuse-Map Compatible with 22LV10/22V10 Devices
- Parametric Compatible with 22LV10
• E2 CELL TECHNOLOGY
- In-System Programmable Logic
- 100% Tested/100% Yields
- High Speed Electrical Erasure (<100ms)
- 20 Year Data Retention
• APPLICATIONS INCLUDE:
- DMA Control
- State Machine Control
- High Speed Graphics Processing
- Software-Driven Hardware Configuration
• ELECTRONIC SIGNATURE FOR IDENTIFICATION
22LV10 Connection Diagram
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