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X20C17

Features: • 24-Pin Standard SRAM DIP Pinout• Fast Access Time: 35ns, 45ns, 55ns• High Reliability -Endurance: 1,000,000 Nonvolatile Store Operations -Retention: 100 Years Minimum• AUTOSTORE™ NOVRAM -Automatically Stores SRAM Data Into the E2PROM Array When VCC Low Thr...

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SeekIC No. : 004547062 Detail

X20C17: Features: • 24-Pin Standard SRAM DIP Pinout• Fast Access Time: 35ns, 45ns, 55ns• High Reliability -Endurance: 1,000,000 Nonvolatile Store Operations -Retention: 100 Years Minimum&#...

X20C17 Data Sheet

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Part Number:
X20C17
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

• 24-Pin Standard SRAM DIP Pinout
• Fast Access Time: 35ns, 45ns, 55ns
• High Reliability
   -Endurance: 1,000,000 Nonvolatile Store Operations
   -Retention: 100 Years Minimum
• AUTOSTORE™ NOVRAM
   -Automatically Stores SRAM Data Into the E2PROM Array When VCC Low Threshold is Detected
   -E2PROM Data Automatically Recalled Into RAM Upon Power-up
• Low Power CMOS
   -Standby: 250A
• Infinite E2PROM Array Recall, and RAM Read and Write Cycles


Pinout

Connection Diagram


Specifications

Temperature under Bias .................. 65°C to +135°C
Storage Temperature ....................... 65°C to +150°C
Voltage on any Pin with
      Respect to VSS ....................................... 1V to +7V
D.C. Output Current ............................................... 10mA
Lead Temperature (Soldering, 10 seconds).......... 300°C


Description

The Xicor X20C17 is a 2K x 8 NOVRAM featuring a highspeed static RAM overlaid bit-for-bit with a nonvolatile electrically erasable PROM (E2PROM) and the AUTOSTORE feature which automatically saves the RAM contents to E2PROM at power-down. The X20C17 is fabricated with advanced CMOS floating gate technology to achieve high speed with low power and wide power-supply margin. The X20C17 features a compatible JEDEC approved byte-wide memory pinout for industry standard SRAMs.




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