WEDPN8M64V-XB2X

Features: · High Frequency = 100, 125, 133MHz· Package:• 219 Plastic Ball Grid Array (PBGA), 21 x 21mm· Single 3.3V ±0.3V power supply· Unbuffered· Fully synchronous; all signals registered on positive edge of system clock cycle· Internal pipelined operation; column address can be changed ev...

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SeekIC No. : 004545615 Detail

WEDPN8M64V-XB2X: Features: · High Frequency = 100, 125, 133MHz· Package:• 219 Plastic Ball Grid Array (PBGA), 21 x 21mm· Single 3.3V ±0.3V power supply· Unbuffered· Fully synchronous; all signals registered on...

floor Price/Ceiling Price

Part Number:
WEDPN8M64V-XB2X
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/21

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Product Details

Description



Features:

· High Frequency = 100, 125, 133MHz
· Package:
• 219 Plastic Ball Grid Array (PBGA), 21 x 21mm
· Single 3.3V ±0.3V power supply
· Unbuffered
· Fully synchronous; all signals registered on positive edge of system clock cycle
· Internal pipelined operation; column address can be changed every clock cycle
· Internal banks for hiding row access/precharge
· Programmable Burst length 1,2,4,8 or full page
· 4,096 refresh cycles
· Commercial, Industrial and Military Temperature Ranges
· Organized as 8M x 64
• User Confi gurable as 2 x 8M x 32 or 4 x 8M x 16
· Weight: WEDPN8M64V-XB2X - 2 grams typical



Specifications

Parameter   Unit
Voltage on VCC, VDDQSupply relative to VSS -1 to 4.6 V
Voltage on NC or I/O pins relative to VSS -1 to 4.6 V
Operating Temperature TA (Mil) -55 to +125 °C
Operating Temperature TA (Ind) -40 to +85 °C
Storage Temperature, Plastic -55 to +125 °C

NOTE:
Stress greater than those listed under "Absolute Maximum Ratings" may cause per ma nent damage to the device. This is a stress rating only and func tion al op er a tion of the device at these or any other conditions greater than those in di cat ed in the operational sections of this specifi cation is not implied. Exposure to ab so lute maximum rating con di tions for extended periods may affect reliability.




Description

The WEDPN8M64V-XB2X is a high-speed CMOS, dynamic random-access memory using 4 chips containing 134,217,728 bits. Each chip is internally confi gured as a quad-bank DRAM with a synchronous interface. Each of the chip's 33,554,432-bit banks is organized as 4,096 rows by 512 columns by 16 bits.

Read and write accesses to the WEDPN8M64V-XB2X are burst oriented; accesses start at a selected location and continue for a programmed number of locations in a programmed sequence. Accesses begin with the registration of an ACTIVE command, which is then followed by a READ or WRITE command. The address bits registered coincident with the ACTIVE command are used to select the bank and row to be accessed (BA0, BA1 select the bank; A0- 11 select the row). The address bits registered coincident with the READ or WRITE command are used to select the starting column location for the burst access.

The WEDPN8M64V-XB2X provides for programmable READ or WRITE burst lengths of 1, 2, 4 or 8 locations, or the full page, with a burst terminate option. An AUTO PRECHARGE function may be enabled to provide a self-timed row precharge that is initiated at the end of the burst sequence.

The WEDPN8M64V-XB2X uses an internal pipelined architecture to achieve high-speed operation. This architecture is compatible with the 2n rule of prefetch architectures, but WEDPN8M64V-XB2X also allows the column address to be changed on every clock cycle to achieve a high-speed, fully random access. Precharging one bank while accessing one of the other three banks will hide the precharge cycles and provide seamless, high-speed, random-access operation.




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