TXC-06125

*Operating conditions exceeding those listed in Absolute Maximum Ratings may cause permanent failure. Exposure to absolute maximum ratings for extended periods may impair device reliability.

**The minimum and maximum allowable ambient operating temperatures, and the maximum power dissipation, will be dependent on the total thermal analysis.

The Bit Error Rate Generator/Receiver (XBERT) VLSI device is a microprocessor-programmable multi-rate test pattern generator and receiver on a single chip. XBERT is used for testing the performance of digital communication circuits and communication links. It provides a bitserial, nibble-parallel or byte-parallel interface, and is capable of operating in a burst data mode by using external signals to enable/disable the transmit and receive clocks. The XBERT generates and analyzes pseudo-random patterns, fixed words, or programmable words. Four pseudo-random test patterns are provided: 2¹⁵ - 1, 2²⁰ - 1, 2²⁰ - 1 with zero suppression (Quasi- Random Signal Source, not available in byte-parallel mode), and 2²³ - 1. The fixed word mode generates and analyzes all zeros, all ones, alternate one/zero pattern or a double alternate one/zero (1100) pattern. The programmable mode allows a choice of one to four bytes
written by the microprocessor.