Features: • E1 (2048 kbit/s) multiplexer/demultiplexer for ITU-T Recommendations: G.742 (8448 kbit/s E2 frame format) G.751 (34368 kbit/s E3 frame format)• Multiplexer/demultiplexer converts: 16 E1s to/from 1 E3 (E13 skip mux), or 16 E1s to/from 4 E2s, or 4 E2s to/from 1 E3 (E12/E23 sp...
TXC-03361: Features: • E1 (2048 kbit/s) multiplexer/demultiplexer for ITU-T Recommendations: G.742 (8448 kbit/s E2 frame format) G.751 (34368 kbit/s E3 frame format)• Multiplexer/demultiplexer conv...
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Features: • Transmits and receives at STS-3/STM-1 rates• Compatible with available opt...
• E1 (2048 kbit/s) multiplexer/demultiplexer for ITU-T Recommendations:
G.742 (8448 kbit/s E2 frame format)
G.751 (34368 kbit/s E3 frame format)
• Multiplexer/demultiplexer converts:
16 E1s to/from 1 E3 (E13 skip mux), or
16 E1s to/from 4 E2s, or
4 E2s to/from 1 E3 (E12/E23 split mux)
• Counters for bipolar violations, frame errors and loss of frame conditions
• E1 digital phase-locked loop circuits with bypass option
• Test features:
PRBS generator and analyzer for E1 channels
Local/Remote Loopbacks for E1, E2 or E3 channels
Corrupt frame generation for E2 and E3 frames
• E2 and E3 bit error rate indications
• E1 and E3 line side interfaces are selectable as positive and negative rail or NRZ with external loss of signal indication on negative input pin
• Microprocessor input/output bus provides multiplexed, Intel or Motorola interfaces
• Test access port for boundary scan
• Single +5 volt, ±5 % power supply
• 208-pin plastic quad flat package
Parameter | Symbol | Min | Max | Unit | Conditions |
Supply voltage | VDD | -0.3 | +7.0 | V | Note 1 |
DC input voltage | VIN | -0.3 | VDD + 0.5 | V | Note 1 |
Ambient operating temperature | TA | -40 | 85 | °C | 0 ft/min linear airflow |
Storage temperature range | TS | -55 | 150 | °C | Note 1 |
Component Temperature x Time | TI | 270 x 5 | °C x s | Note 1 | |
Moisture Exposure Level | ME | 5 | Level | per EIA/JEDEC JESD22-A112-A | |
Relative Humidity, during assembly | RH | 30 | 60 | % |
Note 2 |
Relative Humidity, in-circuit | RH | 0 | 100 | % | non-condensing |
ESD Classification | ESD | absolute value 2000 | V | Note 3 |
Notes:
1. Conditions exceeding the Min or Max values may cause permanent failure. Exposure to conditions near the Min or Max values for extended periods may impair device reliability.
2. Pre-assembly storage in non-drypack conditions is not recommended. Please refer to the instructions on the "CAUTION" label on the drypack bag in which devices are supplied.
3. Test method for ESD per MIL-STD-883D, Method 3015.7.
The E123MUX is a CMOS VLSI device that provides the E13 functions needed to multiplex and demultiplex 16 ndependent E1 signals to and from an E3 signal that conforms to the ITU-T G.751 Recommendation. The E1 and E3 signal interfaces can be either dual unipolar (rail) or NRZ. Digital phase-locked loop circuits are provided for the received E1 signals, but they may be bypassed.
The E123MUX can also be configured to operate as an E12 or E23 multiplexer and demultiplexer. Sixteen E1 signals can be multiplexed and demultiplexed to and from four E2 signals that conform to the ITU-T G.742 Recommendation. Alternatively, four E2 signals can multiplexed and demultiplexed to and from one E3 signal. The E2 signal interfaces are NRZ only. The E123MUX uses memory locations for setting control bits and reporting status information. The status bits have maskable interrupt control bits.