Features: · Single Event Effect (SEE) Hardened· Low RDS(on)· Low Total Gate Charge·Proton Tolerant· Simple Drive Requirements· Ease of Paralleling· Hermetically Sealed· Surface Mount· Ceramic Package· Light WeightSpecifications Parameter Units ID @ VGS = 12V, TC = 25 Contin...
PD - 91708B: Features: · Single Event Effect (SEE) Hardened· Low RDS(on)· Low Total Gate Charge·Proton Tolerant· Simple Drive Requirements· Ease of Paralleling· Hermetically Sealed· Surface Mount· Ceramic Packag...
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Features: · Repetitive Avalanche Ratings· Dynamic dv/dt Rating· Hermetically Sealed·Simple Drive R...
Features: · Single Event Effect (SEE) Hardened· Low RDS(on)· Low Total Gate Charge· Proton Toleran...
Features: · Single Event Effect (SEE) Hardened· Ultra Low RDS(on)· Identical Pre and Post Electric...
Parameter |
Units | ||
ID @ VGS = 12V, TC = 25 |
Continuous Drain or Source Current |
75* |
A |
ID @ VGS = 12V, TC = 100 |
Continuous Drain or Source Current |
75* | |
IDM |
Pulsed Drain Current |
300 | |
PD @ TC = 25 |
Max. Power Dissipation |
300 |
W |
Linear Derating Factor |
2.4 |
W/ | |
VGS |
Gate-to-Source Voltage |
±20 |
V |
EAS |
Single Pulse Avalanche Energy |
800 |
mJ |
IAR |
Avalanche Current |
75 |
A |
EAR |
Repetitive Avalanche Energy |
30 |
mJ |
dv/dt |
Peak Diode Recovery dv/dt |
0.35 |
V/ns |
TJ, TSTG |
Opeating and Storage Temperature Range |
-55 to 150 |
|
Pckg. Mounting Surface Temp. |
300 ( for 5 sec.) | ||
Weight |
3.3 (Typical) |
g |
International Rectifier's RADHard HEXFET® technology of PD - 91708B provides high performance power MOSFETs for space applications. This technology has over a decade of proven performance and reliability in satellite applications. These PD - 91708B have been characterized for both Total Dose and Single Event Effects (SEE). The combination of low Rds(on) and low gate charge reduces the power losses in switching applications such as DC to DC converters and motor control. These PD - 91708B retain all of the well established advantages of MOSFETs such as voltage control, fast switching, ease of paralleling and temperature stability of electrical parameters.