Features: · Single Event Effect (SEE) Hardened· Low RDS(on)· Low Total Gate Charge· Proton Tolerant· Simple Drive Requirements· Ease of Paralleling· Hermetically Sealed· Surface Mount· Light WeightSpecifications Parameter Units ID @ VGS = 12V, TC = 25 Continuous Drain Cur...
PD - 91396C: Features: · Single Event Effect (SEE) Hardened· Low RDS(on)· Low Total Gate Charge· Proton Tolerant· Simple Drive Requirements· Ease of Paralleling· Hermetically Sealed· Surface Mount· Light WeightS...
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Features: · Repetitive Avalanche Ratings· Dynamic dv/dt Rating· Hermetically Sealed·Simple Drive R...
Features: · Single Event Effect (SEE) Hardened· Low RDS(on)· Low Total Gate Charge·Proton Tolerant...
Features: · Single Event Effect (SEE) Hardened· Ultra Low RDS(on)· Identical Pre and Post Electric...
Parameter |
Units | ||
ID @ VGS = 12V, TC = 25 |
Continuous Drain Current |
51 |
A |
ID @ VGS = 12V, TC = 100 |
Continuous Drain Current |
32.5 | |
IDM |
Pulsed Drain Current |
204 | |
PD @ TC = 25 |
Max. Power Dissipation |
300 |
W |
Linear Derating Factor |
2.4 |
W/ | |
VGS |
Gate-to-Source Voltage |
±20 |
V |
EAS |
Single Pulse Avalanche Energy |
500 |
mJ |
IAR |
Avalanche Current |
51 |
A |
EAR |
Repetitive Avalanche Energy |
30 |
mJ |
dv/dt |
Peak Diode Recovery dv/dt |
7.3 |
V/ns |
TJ TSTG |
Operating Junction Storage Temperature Range |
-55 to 150 |
|
Pckg. Mounting Surface Temp. |
300 ( for 5s) | ||
Weight |
3.3 (Typical) |
g |
International Rectifier's RADHard HEXFET® technology of PD - 91396C provides high performance power MOSFETs for pace applications. This technology has over a decade f proven performance and reliability in satellite pplications. These PD - 91396C have been characterized or both Total Dose and Single Event Effects (SEE). he combination of low Rdson and low gate charge educes the power losses in switching applications uch as DC to DC converters and motor control. These PD - 91396C retain all of the well established advantages f MOSFETs such as voltage control, fast switching, ase of paralleling and temperature stability of electrical arameters.