NAND01G-AAZ3E

Features: HIGH DENSITY NAND FLASH MEMORIES Up to 1 Gbit memory array Up to 32 Mbit spare area Cost effective solutions for mass storage applications NAND INTERFACE x8 or x16 bus width Multiplexed Address/ Data Pinout compatibility for all densities SUPPLY VOLTAGE 1.8V device: VDD = 1.7 to 1.95V 3...

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SeekIC No. : 004432664 Detail

NAND01G-AAZ3E: Features: HIGH DENSITY NAND FLASH MEMORIES Up to 1 Gbit memory array Up to 32 Mbit spare area Cost effective solutions for mass storage applications NAND INTERFACE x8 or x16 bus width Multiplexed A...

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Part Number:
NAND01G-AAZ3E
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/12/22

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Product Details

Description



Features:

HIGH DENSITY NAND FLASH MEMORIES
Up to 1 Gbit memory array
Up to 32 Mbit spare area
Cost effective solutions for mass storage applications
NAND INTERFACE
x8 or x16 bus width
Multiplexed Address/ Data
Pinout compatibility for all densities
SUPPLY VOLTAGE
1.8V device: VDD = 1.7 to 1.95V
3.0V device: VDD = 2.7 to 3.6V
PAGE SIZE
x8 device: (512 + 16 spare) Bytes
x16 device: (256 + 8 spare) Words
BLOCK SIZE
x8 device: (16K + 512 spare) Bytes
x16 device: (8K + 256 spare) Words
PAGE READ / PROGRAM
Random access: 12µs (max)
Sequential access: 50ns (min)
Page program time: 200µs (typ)
COPY BACK PROGRAM MODE
Fast page copy without external buffering
FAST BLOCK ERASE
Block erase time: 2ms (Typ) STATUS REGISTER



Pinout

  Connection Diagram


Description

The NAND Flash 528 Byte/ 264 Word Page is a family of non-volatile Flash memories that uses the Single Level Cell (SLC) NAND cell technology. NAND01G-AAZ3E is referred to as the Small Page family. The NAND01G-AAZ3E devices range from 128Mbits to 1Gbit and operate with either a 1.8V or 3V voltage supply. The size of a Page is either 528 Bytes (512 + 16 spare) or 264 Words (256 + 8 spare) depending on whether the device has a x8 or x16 bus width.

The address lines of NAND01G-AAZ3E are multiplexed with the Data Input/ Output signals on a multiplexed x8 or x16 Input/ Output bus. This interface reduces the pin count and makes NAND01G-AAZ3E possible to migrate to other densities without changing the footprint. Each block can be programmed and erased over 100,000 cycles. To extend the lifetime of NAND Flash devices it is strongly recommended to implement an Error Correction Code (ECC).

A Write Protect pin is available to give a hardware protection against program and erase operations. The NAND01G-AAZ3E devices feature an open-drain Ready/Busy output that can be used to identify if the Program/ Erase/Read (P/E/R) Controller is currently active. The use of an open-drain output allows the Ready/ Busy pins from several memories to be connected to a single pull-up resistor. A Copy Back command is available to optimize the management of defective blocks. When a Page Program operation fails, the data can be programmed in another page without having to resend the data to be programmed.




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