Features: · Single Event Effect (SEE) Hardened· Ultra Low RDS(on)· Low Total Gate Charge· Proton Tolerant· Simple Drive Requirements· Ease of Paralleling· Hermetically Sealed· Light WeightSpecifications Parameter Units ID @ VGS = 12V, TC = 25°C Continuous Drain Current 26 ...
IRHM7250SE: Features: · Single Event Effect (SEE) Hardened· Ultra Low RDS(on)· Low Total Gate Charge· Proton Tolerant· Simple Drive Requirements· Ease of Paralleling· Hermetically Sealed· Light WeightSpecificat...
SeekIC Buyer Protection PLUS - newly updated for 2013!
268 Transactions
All payment methods are secure and covered by SeekIC Buyer Protection PLUS.
Features: ·Radiation Hardened up to 1 x 105 Rads (Si)·Single Event Burnout (SEB) Hardened·Single E...
Parameter |
Units | ||
ID @ VGS = 12V, TC = 25°C | Continuous Drain Current |
26 |
A |
ID @ VGS = 12V, TC = 100°C | Continuous Drain Current |
16 | |
IDM |
Pulsed Drain Current |
104 | |
PD @ TC = 25°C | Max. Power Dissipation |
150 |
W |
Linear Derating Factor |
1.2 |
W/ | |
VGS |
Gate-to-Source Voltage |
±20 |
V |
EAS |
Single Pulse Avalanche Energy |
500 |
mJ |
IAR |
Avalanche Current |
26 |
A |
EAR |
Repetitive Avalanche Energy |
15 |
mJ |
dv/dt |
Peak Diode Recovery dv/dt |
5.9 |
V/ns |
TJ |
Operating Junction Storage Temperature Range |
-55 to 150 |
|
Lead Temperature |
300 (0.063 in. (1.6mm) from case for 10 sec.) | ||
Weight |
9.3 (Typical) |
g |
International Rectifier IRHM7250SE's RADHardTM HEXFET® MOSFET technology provides high performance power MOSFETs IRHM7250SE for space applications. This technology IRHM7250SE has over a decade of proven performance and reliability in satellite applications. These devices IRHM7250SE have been characterized for both Total Dose and Single Event Effects (SEE). The combination of low RDS (on) and low gate charge reduces the power losses in switching applications such as DC to DC converters and motor control. These devices IRHM7250SE retain all of the well established advantages of MOSFETs such as voltage control, fast switching, ease of paralleling and temperature stability of electrical parameters.