Features: ·Single Event Effect (SEE) Hardened·Low RDS(on)·Low Total Gate Charge·Proton Tolerant·Simple Drive Requirements·Ease of Paralleling·Hermetically Sealed·Ceramic Package·Light WeightSpecifications Parameter Units ID @ VGS = 12V, TC = 25 Continuous Drain Current 1.6 A ID ...
IRHG57110: Features: ·Single Event Effect (SEE) Hardened·Low RDS(on)·Low Total Gate Charge·Proton Tolerant·Simple Drive Requirements·Ease of Paralleling·Hermetically Sealed·Ceramic Package·Light WeightSpecific...
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Features: · Single Event Effect (SEE) Hardened· Low RDS(on)· Low Total Gate Charge· Proton Toleran...
Features: · Single Event Effect (SEE) Hardened· Low RDS(on)· Low Total Gate Charge· Proton Toleran...
Parameter | Units | ||
ID @ VGS = 12V, TC = 25 | Continuous Drain Current | 1.6 | A |
ID @ VGS = 12V, TC = 100 | Continuous Drain Current | 1.0 | |
IDM | Pulsed Drain Current | 6.4 | |
PD @ TC = 25 | Max. Power Dissipation | 1.4 | W |
Linear Derating Factor | 0.011 | W/ | |
VGS | Gate-to-Source Voltage | ±20 | V |
EAS | Single Pulse Avalanche Energy | 130 | mJ |
IAR | Avalanche Current | 1.6 | A |
EAR | Repetitive Avalanche Energy | 0.14 | mJ |
dv/dt | Peak Diode Recovery dv/dt | 6.5 | V/ns |
TJ TSTG |
Operating Junction Storage Temperature Range |
-55 to 150 | |
Lead Temperature | 300 (0.063 in./1.6mm from case for 10s) | ||
Weight | 1.3 (Typical) | g |
International Rectifier's RAD-HardTM HEXFET® MOSFET Technology IRHG57110 provides high performance power MOSFETs for space applications. This technology has over a decade of proven performance and reliability in satellite applications. These devices IRHG57110 have been characterized for both Total Dose and Single Event Effects (SEE). The combination of low RDS(on) and low gate charge reduces the power losses in switching applications such as DC to DC converters and motor control. These devices IRHG57110 retain all of the well established advantages of MOSFETs such as voltage control, fast switching, ease of paralleling and temperature stability of electrical parameters.