FDZ2551N

MOSFET USE 512-FDZ2553N Common Drain

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SeekIC No. : 00165660 Detail

FDZ2551N: MOSFET USE 512-FDZ2553N Common Drain

floor Price/Ceiling Price

Part Number:
FDZ2551N
Mfg:
Fairchild Semiconductor
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/12/21

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Product Details

Quick Details

Transistor Polarity : N-Channel Drain-Source Breakdown Voltage : 20 V
Gate-Source Breakdown Voltage : +/- 12 V Continuous Drain Current : 9 A
Resistance Drain-Source RDS (on) : 0.018 Ohms Configuration : Dual Common Drain
Maximum Operating Temperature : + 150 C Mounting Style : SMD/SMT
Package / Case : BGA Packaging : Reel    

Description

Transistor Polarity : N-Channel
Mounting Style : SMD/SMT
Packaging : Reel
Maximum Operating Temperature : + 150 C
Drain-Source Breakdown Voltage : 20 V
Gate-Source Breakdown Voltage : +/- 12 V
Continuous Drain Current : 9 A
Configuration : Dual Common Drain
Resistance Drain-Source RDS (on) : 0.018 Ohms
Package / Case : BGA


Features:

9 A, 20 V.  RDS(ON) = 0.018 @ VGS = 4.5 V 
                    RDS(ON) = 0.030 @ VGS = 2.5 V.
Occupies only 0.10 cm2  of PCB area. 1/3 the area of SO-8.
Ultra-thin package: less than 0.70 mm height when mounted to PCB.
Outstanding thermal transfer characteristics: significantly better than SO-8.
Ultra-low Qg x RDS(ON) figure-of-merit.
High power and current handling capability.



Application

Battery management
Load switch
Battery protection



Pinout

  Connection Diagram


Specifications

Symbol Parameter Ratings Units
VDSS Drain-Source Voltage 20  V
VGSS Gate-Source Voltage ±12 V
ID Drain Current Continuous (Note 1a) Pulsed 9 A
  20
PD Power Dissipation (Steady State) (Note 1a) 3 W
TJ, Tstg Operating and Storage Junction Temperature Range 55 to +150  



Description

Combining Fairchild's advanced 2.5V specified PowerTrench process with state of the art BGA packaging, the FDZ2551N minimizes both PCB space and RDS(ON).  This dual BGA MOSFET embodies a breakthrough in packaging technology which enables the device to combine excellent thermal transfer characteristics, high current handling capability, ultra-low profile packaging, low gate charge, and low RDS(ON).  


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