Features: * Low Noise Figure:1.1 dB Typical at 12 GHz* High Associated Gain:9.5 dB Typical at 12 GHz* High Output Power:17.5 dBm Typical P1 dB at 12 GHzSpecifications Symbol Parameter Units AbsoluteMaximum[1] VDS Drain-Source Voltage V +5 VGS Gate-Source Voltage V -4 VGD Ga...
ATF-13100: Features: * Low Noise Figure:1.1 dB Typical at 12 GHz* High Associated Gain:9.5 dB Typical at 12 GHz* High Output Power:17.5 dBm Typical P1 dB at 12 GHzSpecifications Symbol Parameter Units ...
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Symbol | Parameter | Units | Absolute Maximum[1] |
VDS | Drain-Source Voltage | V | +5 |
VGS | Gate-Source Voltage | V | -4 |
VGD | Gate-Drain Voltage | V | -6 |
IDS | Drain Current | mA | IDSS |
PT | Power Dissipation [2,3] | mW | 225 |
TCH | Channel Temperature | °C | 175 |
TSTG | Storage Temperature | °C | -65 to +175 |
Notes:
1. Permanent damage may occur if any of these limits are exceeded.
2. TMOUNTING SURFACE = 25°C.
3. Derate at 4 mW/°C for TMOUNTING SURFACE > 119°C.
4. The small spot size of this technique results in a higher, though more accurate determination of jc than do alternate methods. See MEASUREMENTS section for more information.
The ATF-13100 is a high performance gallium arsenide Schottky-barrier-gate field effect transistor chip. This device is designed for use in low noise, wideband amplifier and oscillator applications in the 2-18? GHz frequency range.This GaAs FET device has a nominal 0.3 micron gate length with a total gate periphery of 250 microns. Proven gold basedmetallization systems and nitrid passivation assure a rugged,reliable device.
The ATF-13100 recommended mounting procedure is to die attach at a stage temperature of 300°C using a gold-tin preform under forming gas. Assembly can be preformed with either wedge or ball bonding using 0.7 mil gold wire. See also "Chip Use" in the APPLICATIONS section.