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AS7C331MNTF36A

Features: • Organization: 1,048,576 words × 32 or 36 bits• NTD™architecture for efficient bus operation• Fast clock to data access: 7.5/8.5/10 ns• FastOE access time: 3.5/4.0 ns• Fully synchronous operation• Flow-through mode• Asynchronous output ena...

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SeekIC No. : 004288515 Detail

AS7C331MNTF36A: Features: • Organization: 1,048,576 words × 32 or 36 bits• NTD™architecture for efficient bus operation• Fast clock to data access: 7.5/8.5/10 ns• FastOE access time: 3...

AS7C331MNTF36A Data Sheet

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Part Number:
AS7C331MNTF36A
Supply Ability:
5000

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  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

• Organization: 1,048,576 words × 32 or 36 bits
• NTD™architecture for efficient bus operation
• Fast clock to data access: 7.5/8.5/10 ns
• Fast OE access time: 3.5/4.0 ns
• Fully synchronous operation
• Flow-through mode
• Asynchronous output enable control
• Available in 100-pin TQFP package
• Byte write enables
• Clock enable for operation hold
• Multiple chip enables for easy expansion
• 3.3V core power supply
• 2.5V or 3.3V I/O operation with separate VDDQ
• Self-timed write cycles
• Interleaved or linear burst modes
• Snooze mode for standby operation


Pinout

Connection Diagram


Specifications

Parameter
Symbol
Min
Max
Unit
Power supply voltage relative to GND

Input voltage relative to GND (input pins)

Input voltage relative to GND (I/O pins)

Power dissipation

Short circuit output current

Storage temperature

Temperature under bias
VDD, VDDQ

VIN

VIN

Pd

IOUT

Tstg

Tbias
0.5

0.5

0.5





65

65
+4.6

VDD + 0.5

VDDQ + 0.5

1.8

20

+150

+135
V

V

V

W

mA

°C

°C

Stresses greater than those listed under "Absolute maximum ratings" may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions may affect reliability.




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