TC7WG04FK, TC7WG04FU, TC7WG08FC Selling Leads, Datasheet
MFG:TOSHIBA Package Cooled:US-9 D/C:2008+
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TC7WG04FK, TC7WG04FU, TC7WG08FC Datasheet download
Part Number: TC7WG04FK
MFG: TOSHIBA
Package Cooled: US-9
D/C: 2008+
MFG:TOSHIBA Package Cooled:US-9 D/C:2008+
TC7WG04FK, TC7WG04FU, TC7WG08FC Datasheet download
MFG: TOSHIBA
Package Cooled: US-9
D/C: 2008+
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Datasheet: TC7WG04FK
File Size: 201003 KB
Manufacturer: TOSHIBA [Toshiba Semiconductor]
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PDF/DataSheet Download
Datasheet: TC7WG04FU
File Size: 201003 KB
Manufacturer: TOSHIBA [Toshiba Semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: TC70
File Size: 92092 KB
Manufacturer: TELCOM [TelCom Semiconductor, Inc]
Download : Click here to Download
Characteristics | Symbol | Ratingh | Unit |
Power supply viltage | VCC | −0.5~4.6 | V |
DC input voltage | VIN | −0.5~7.0 | V |
DC output voltage | VOUT | −0.5~4.6 (Note 1) | V |
−0.5~VCC + 0.5 (Note 2) | |||
Input diode current | IIK | −20 | mA |
Output diode current | IOK | −20 (Note 3) | mA |
DC output current | IOUT | ±25 | mA |
DC VCC/GND current | ICC | ±50 | mA |
Power dissipation | PD | 300 (SM8) 200 (US8) |
mW |
Storage temperature | Tstg | −65~150 | °C |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Note 1: VCC = 0V
Note 2: High or Low State. IOUT absolute maximum rating must be observed.
Note 3: VOUT < GND
Characteristics | Symbol | Ratingh | Unit |
Power supply viltage | VCC | −0.5~4.6 | V |
DC input voltage | VIN | −0.5~7.0 | V |
DC output voltage | VOUT | −0.5~4.6 (Note 1) | V |
−0.5~VCC + 0.5 (Note 2) | |||
Input diode current | IIK | −20 | mA |
Output diode current | IOK | −20 (Note 3) | mA |
DC output current | IOUT | ±25 | mA |
DC VCC/GND current | ICC | ±50 | mA |
Power dissipation | PD | 300 (SM8) 200 (US8) |
mW |
Storage temperature | Tstg | −65~150 | °C |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Note 1: VCC = 0V
Note 2: High or Low State. IOUT absolute maximum rating must be observed.
Note 3: VOUT < GND
Characteristic |
Symbol |
Value |
Unit |
Power supply voltage |
VCC |
−0.5~4.6 |
V |
DC input voltage |
VIN |
−0.5~7.0 |
V |
DC output voltage |
VOUT |
−0.5~4.6 (Note 1) −0.5~VCC + 0.5 (Note 2) |
V |
Input diode current |
IIK |
−20 |
mA |
Output diode current |
IOK |
−20 (Note 3) |
mA |
DC output current |
IOUT |
±25 |
mA |
DC VCC/GND current |
ICC |
±50 |
mA |
Power dissipation |
PD |
150 (Note 4) |
mW |
Storage temperature |
Tstg |
−65~150 |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Note 1: VCC = 0V
Note 2: High or Low State. IOUT absolute maximum rating must be observed.
Note 3: VOUT < GND Note 4: Mounted on an FR4 board. (25.4 mm * 25.4 mm * 1.6 t, Cu Pad: 11.56 mm2)