TC7WG00FK, TC7WG00FU, TC7WG02FC Selling Leads, Datasheet
MFG:TOSHIBA Package Cooled:US-8 D/C:07+
TC7WG00FK, TC7WG00FU, TC7WG02FC Datasheet download
Part Number: TC7WG00FK
MFG: TOSHIBA
Package Cooled: US-8
D/C: 07+
MFG:TOSHIBA Package Cooled:US-8 D/C:07+
TC7WG00FK, TC7WG00FU, TC7WG02FC Datasheet download
MFG: TOSHIBA
Package Cooled: US-8
D/C: 07+
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PDF/DataSheet Download
Datasheet: TC7WG00FK
File Size: 201422 KB
Manufacturer: TOSHIBA [Toshiba Semiconductor]
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PDF/DataSheet Download
Datasheet: TC7WG00FU
File Size: 201422 KB
Manufacturer: TOSHIBA [Toshiba Semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: TC7WG02FC
File Size: 181125 KB
Manufacturer: TOSHIBA [Toshiba Semiconductor]
Download : Click here to Download
Characteristics | Symbol | Ratingh | Unit |
Power supply viltage | VCC | −0.5~4.6 | V |
DC input voltage | VIN | −0.5~7.0 | V |
DC output voltage | VOUT | −0.5~4.6 (Note 1) | V |
−0.5~VCC + 0.5 (Note 2) | |||
Input diode current | IIK | −20 | mA |
Output diode current | IOK | −20 (Note 3) | mA |
DC output current | IOUT | ±25 | mA |
DC VCC/GND current | ICC | ±50 | mA |
Power dissipation | PD | 300 (SM8) 200 (US8) |
mW |
Storage temperature | Tstg | −65~150 | °C |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Note 1: VCC = 0V
Note 2: High or Low State. IOUT absolute maximum rating must be observed.
Note 3: VOUT < GND
Characteristics | Symbol | Ratingh | Unit |
Power supply viltage | VCC | −0.5~4.6 | V |
DC input voltage | VIN | −0.5~7.0 | V |
DC output voltage | VOUT | −0.5~4.6 (Note 1) | V |
−0.5~VCC + 0.5 (Note 2) | |||
Input diode current | IIK | −20 | mA |
Output diode current | IOK | −20 (Note 3) | mA |
DC output current | IOUT | ±25 | mA |
DC VCC/GND current | ICC | ±50 | mA |
Power dissipation | PD | 300 (SM8) 200 (US8) |
mW |
Storage temperature | Tstg | −65~150 | °C |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Note 1: VCC = 0V
Note 2: High or Low State. IOUT absolute maximum rating must be observed.
Note 3: VOUT < GND
Characteristics | Symbol | Ratingh | Unit |
Power supply viltage | VCC | −0.5~4.6 | V |
DC input voltage | VIN | −0.5~7.0 | V |
DC output voltage | VOUT | −0.5~4.6 (Note 1) | V |
−0.5~VCC + 0.5 (Note 2) | |||
Input diode current | IIK | −20 | mA |
Output diode current | IOK | −20 (Note 3) | mA |
DC output current | IOUT | ±25 | mA |
DC VCC/GND current | ICC | ±50 | mA |
Power dissipation | PD | 150 (Note 4) | mW |
Storage temperature | Tstg | −65~150 | °C |
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Note 1: VCC = 0V
Note 2: High or Low State. IOUT absolute maximum rating must be observed.
Note 3: VOUT < GND
Note 4: Mounted on an FR4 board.
(25.4 mm * 25.4 mm * 1.6 t, Cu Pad: 11.56 mm2)