KC73129-M-R, KC73129UB, KC73129UBA Selling Leads, Datasheet
MFG:400 Package Cooled:SAMSUNG D/C:98
KC73129-M-R, KC73129UB, KC73129UBA Datasheet download
Part Number: KC73129-M-R
MFG: 400
Package Cooled: SAMSUNG
D/C: 98
MFG:400 Package Cooled:SAMSUNG D/C:98
KC73129-M-R, KC73129UB, KC73129UBA Datasheet download
MFG: 400
Package Cooled: SAMSUNG
D/C: 98
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PDF/DataSheet Download
Datasheet: KC73125MP
File Size: 212299 KB
Manufacturer: SAMSUNG [Samsung semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: KC73129UBA
File Size: 232469 KB
Manufacturer: SAMSUNG [Samsung semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: KC73129UBA
File Size: 232469 KB
Manufacturer: SAMSUNG [Samsung semiconductor]
Download : Click here to Download
The KC73129UBA is an interline transfer CCD area image sensor developed for CCIR 1/3 inch optical format video cameras, surveillance cameras, object detectors and image pattern recognizers. High sensitivity is achieved through the onchip micro lenses and HAD (Hole Accumulated Diode) photosensors. This chip features a field integration read out system and an electronic shutter with variable charge storage time.
Characteristics |
Symbols |
Min. |
Max. |
Unit |
Substrate voltage | SUB - GND |
-0.3 |
55 |
V |
Supply voltage | VDD, VOUT, VSS - GND |
-0.3 |
18 |
V |
VDD, VOUT, VSS - SUB |
-55 |
10 |
V | |
Vertical clock input voltage | V1,V2, V3, V4 - GND |
-10 |
20 |
V |
V1, V2, V3, V4 - VL |
-0.3 |
30 |
V | |
V1, V2, V3, V4 - SUB |
-55 |
10 |
V | |
Horizontal clock input voltage | H1, H2 - GND |
-0.3 |
10 |
V |
H1, H2 - SUB |
-55 |
17 |
V | |
Voltage dierence between vertical and horizontal clock input pins |
V1, V2, V3, V4 |
15 |
V | |
27 |
V | |||
H1, H2 |
17 |
V | ||
H1, H2 - V4 |
-17 |
17 |
V | |
Output clock input voltage | RS, VGG - GND |
-0.3 |
15 |
V |
RS, VGG - SUB |
-55 |
10 |
V | |
Protection circuit bias voltage | VL - SUB |
-55 |
10 |
V |
Operating temperature | TOP |
-10 |
60 |
°C |
Storage temperature | TSTG |
-30 |
80 |
°C |
NOTE: The device can be destroyed, if the applied voltage or temperature is higher than the absolute maximum rating voltage or temperature.