MFG:2000 Package Cooled:SAMSUNG D/C:04+
K7P403611MHC20, K7P403622B, K7P403622B-GC200 Datasheet download
MFG: 2000
Package Cooled: SAMSUNG
D/C: 04+
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PDF/DataSheet Download
Datasheet: K7P401822B-HC16
File Size: 286939 KB
Manufacturer: SAMSUNG [Samsung semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: K7P403622B
File Size: 286939 KB
Manufacturer: SAMSUNG [Samsung semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: K7P401822B-HC16
File Size: 286939 KB
Manufacturer: SAMSUNG [Samsung semiconductor]
Download : Click here to Download
The K7P403622B and K7P401822B are 4,718,592 bit Synchronous Pipeline Mode SRAM devices. They are organized as 131,072 words by 36 bits for K7P403622B and 262,144 words by 18 bits for K7P401822B, fabricated using Samsung's advanced CMOS technology.
Single differential PECL level K clocks or Single ended or differential LVTTL clocks are used to initiate read/write operation and all internal operations are self-timed. At the rising edge of K clock, Addresses, Write Enables,Synchronous Select and Data Ins are registered internally. Data outs are updated from output registers at the next rising edge of K clock. An internal write data buffer allows write data to follow one cycle after addresses and controls. The package is 119(7x17) Ball Grid Array with balls on a 1.27mm pitch.
| Parameter | Symbol | Value | Unit |
| Core Supply Voltage Relative to VSS | VDD | -0.3 to 4.6 | V |
| Output Supply Voltage Relative to VSS | VDDQ | VDD | V |
| Voltage on any I/O pin Relative to VSS | VTERM | -0.3 to VDD+0.3 | V |
| Output Short-Circuit Current(per I/O) | IOUT | 25 | mA |
| Operating Temperature | TOPR | 0 to 70 | °C |
| Storage Temperature | TSTR | -65 to 150 | °C |
NOTE : Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operating sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
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