K4F151611CTC60, K4F151611D, K4F151611D-IL60 Selling Leads, Datasheet
MFG:SAMSUNG D/C:16
K4F151611CTC60, K4F151611D, K4F151611D-IL60 Datasheet download
Part Number: K4F151611CTC60
MFG: SAMSUNG
Package Cooled:
D/C: 16
MFG:SAMSUNG D/C:16
K4F151611CTC60, K4F151611D, K4F151611D-IL60 Datasheet download
MFG: SAMSUNG
Package Cooled:
D/C: 16
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PDF/DataSheet Download
Datasheet: K4F151611
File Size: 541679 KB
Manufacturer: SAMSUNG [Samsung semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: K4F151611D
File Size: 541679 KB
Manufacturer: SAMSUNG [Samsung semiconductor]
Download : Click here to Download
PDF/DataSheet Download
Datasheet: K4F151611
File Size: 541679 KB
Manufacturer: SAMSUNG [Samsung semiconductor]
Download : Click here to Download
This is a family of 1,048,576 x 16 bit Fast Page Mode CMOS DRAMs. Fast Page Mode offers high speed random access of memory cells within the same row. Power supply voltage (+5.0V or +3.3V), refresh cycle (1K Ref. or 4K Ref.), access time (-50 or -60), power consumption(Normal or Low power) and package type(SOJ or TSOP-II) are optional features of this family. All of this family have CASbefore-RAS refresh,RAS-only refresh and Hidden refresh capabilities. Furthermore, Self-refresh operation is available in L-version. This 1Mx16 Fast Page Mode DRAM family is fabricated using Samsung¢s advanced CMOS process to realize high band-width, low power consumption and high reliability. It may be used as graphic memory unit for microcomputer, personal computer and portable machines.
Parameter | Symbol | Rating | Units | |
3.3V | 5V | |||
Voltage on any pin relative to VSS | VIN,VOUT | -0.5 to +4.6 | -1.0 to +7.0 | V |
Voltage on VCC supply relative to VSS | VCC | -0.5 to +4.6 | -1.0 to +7.0 | V |
Storage Temperature | Tstg | -55 to +150 | -55 to +150 | °C |
Power Dissipation | PD | 1 | 1 | W |
Short Circuit Output Current | IOS Address | 50 | 50 | mA |
* Permanent device damage may occur if "ABSOLUTE MAXIMUM RATINGS" are exceeded. Functional operation should be restricted to the conditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.