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This device contains four independent gates, each of which performs the logic NAND function.
74F00 Maximum Ratings
Storage Temperature .........................................................................................-65 to +150 Ambient Temperature under Bias .......................................................................-55 to +125 Junction Temperature under Bias .......................................................................-55 to +175 Plastic ..............................................................................................................-55 to +150 VCC Pin Potential to Ground Pin ........................................................................................................-0.5V to +7.0V Input Voltage (Note 2) .........................................................................................-0.5V to +7.0V Input Current (Note 2) ...................................................................................-30 mA to +5.0 mA Voltage Applied to Output in HIGH State (with VCC e 0V) Standard Output ..................................................................................................-0.5V to VCC TRI-STATE® Output ...........................................................................................-0.5V to +5.5V Current Applied to Output in LOW State (Max) ..............................................................................twice the rated IOL (mA) ESD Last Passing Voltage (Min) ...........................................................................................4000V