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MCR718

Features: • Small Size• Passivated Die for Reliability and Uniformity• Low Level Triggering and Holding Characteristics• Surface Mount Lead Form − Case 369C• Epoxy Meets UL 94, V−0 @ 0.125 in• ESD Ratings: Human Body Model, 3B > 8000 V Machine Model,...

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SeekIC No. : 004418735 Detail

MCR718: Features: • Small Size• Passivated Die for Reliability and Uniformity• Low Level Triggering and Holding Characteristics• Surface Mount Lead Form − Case 369C• Epox...

MCR718 Data Sheet

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Part Number:
MCR718
Supply Ability:
5000

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  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/26

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Product Details

Description



Features:

• Small Size
• Passivated Die for Reliability and Uniformity
• Low Level Triggering and Holding Characteristics
• Surface Mount Lead Form − Case 369C
• Epoxy Meets UL 94, V−0 @ 0.125 in
• ESD Ratings: Human Body Model, 3B > 8000 V Machine Model, C > 400 V


Specifications

Parameter
Symbol
Value
Unit
Peak Repetitive Off−State Voltage
(Note 1) (TJ = −40 to 110°C, Sine
Wave, 50 to 60 Hz, Gate Open)
MCR716
MCR718
VDRM
VRRM
400
600
Volts
On−State RMS Current
(180° Conduction Angles; TC = 90°C)
IT(RMS)
4.0
A
 Average On−State Current
(180° Conduction Angles; TC = 90°C)		       IT(AV)          2.6          A
Peak Non-Repetitive Surge Current
(1/2 Cycle, Sine Wave 60 Hz,
TJ = 110°C)
ITSM
25
A
Circuit Fusing Consideration (t = 8.3 ms)
I2t
2.6
A2sec
Peak Gate Power (Pulse Width 1.0 s, TC = 80°C)
PGM
0.5
Watts
Average Gate Power (t = 8.3 ms, TC = 80°C)
PG(AV)
0.1
Watts
Peak Gate Current (Pulse Width 3 1.0 ms, TC = 80°C)
IGM
0.2
A
Operating Junction Temperature Range
TJ
40 to +110
°C
Storage Temperature Range
Tstg
40 to +150
°C

Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected.
1. VDRM and VRRM for all types can be applied on a continuous basis. Ratings apply for zero or negative gate voltage; positive gate voltage shall not be applied concurrent with negative potential on the anode. Blocking voltages shall not be tested with a constant current source such that the voltage ratings of the devices are exceeded.




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