XC17S00A

Features: • Configuration one-time programmable (OTP) read-only memory designed to store configuration bitstreams forSpartan-II/Spartan-IIE FPGA devices• Simple interface to the Spartan device• Programmable reset polarity (active High or active Low)• Low-power CMOS floating...

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SeekIC No. : 004547708 Detail

XC17S00A: Features: • Configuration one-time programmable (OTP) read-only memory designed to store configuration bitstreams forSpartan-II/Spartan-IIE FPGA devices• Simple interface to the Spartan ...

floor Price/Ceiling Price

Part Number:
XC17S00A
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/20

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Product Details

Description



Features:

• Configuration one-time programmable (OTP) read-only memory designed to store configuration bitstreams for
Spartan-II/Spartan-IIE FPGA devices
• Simple interface to the Spartan device
• Programmable reset polarity (active High or active Low)
• Low-power CMOS floating gate process
• 3.3V PROM
• Available in compact plastic 8-pin DIP, 8-pin VOIC,20-pin SOIC, or 44-pin VQFP packages.
• Programming support by leading programmer manufacturers.
• Design support using the Xilinx Alliance and Foundation series software packages.
• Guaranteed 20-year life data retention



Pinout

  Connection Diagram


Specifications

Symbol
Description
Value
Units
VCC
Supply voltage relative to GND
0.5 to +4.0
V
VIN
Input voltage with respect to GND
0.5 to VCC +0.5
V
VTS
Voltage applied to High-Z output
0.5 to VCC +0.5
V
TSTG
Storage temperature (ambient)
65 to +150
TSOL
Maximum soldering temperature (10s @ 1/16 in.)
+260
1. Stresses beyond those listed under Absolute Maximum Ratings might cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those listed under Operating Conditions is not implied. Exposure to Absolute Maximum Ratings conditions for extended periods of time might affect device reliability.


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