Features: SpecificationsDescriptionThe Xicor X2816AM is a 2K*8 E2PROM. The X2001 is fabricated with the same reliable N-channel floating gate MOS technology used in all Xicor 5V programmable nonvolatile memories. The X2816AM features the JEDEC approved pinout for byte-wide memories, compatible wit...
X2816AM: Features: SpecificationsDescriptionThe Xicor X2816AM is a 2K*8 E2PROM. The X2001 is fabricated with the same reliable N-channel floating gate MOS technology used in all Xicor 5V programmable nonvola...
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The Xicor X2816AM is a 2K*8 E2PROM. The X2001 is fabricated with the same reliable N-channel floating gate MOS technology used in all Xicor 5V programmable nonvolatile memories. The X2816AM features the JEDEC approved pinout for byte-wide memories, compatible with industry standard RAMs, ROMs, and EPROMs.Xicor E2PROMs are designed and tested for applications requiring extended endurance. Data retention is specified to be greater than 100 years.
The X2816AM has many features, here lists some of them. The first one is: Simple byte write operation. The second one is: Reliable N-Channel floating gate MOS technology. The third one is: single 5V supply. The fourth one is: byte write time(10ms Max). The fifth one is: fast access time (300 ns Max). The sixth one is: lower power dissipation. And the last one is: JEDEC approved byte-wide pinout.
The following gives the absolute maximum ratings of some of the important parameters of the X2816AM. The Temperature Under Bias of X2816A, is from -65 to +135. The Storage Temperature is between -65 and +150. The Voltage on any Pin with Respect to Ground is between -1.0V and +7V. The D.C. Output Current is 5mA. And the Load Temperature (Soldering, 10 Seconds) is 300.
Next are some comments for the parameters. Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and the functional operation of the X2816AM at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
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