Features: ·Data rate = 200, 250, 266, 333Mbs·Package:• 208 Plastic Ball Grid Array (PBGA), 16 x 22mm·2.5V ±0.2V core power supply·2.5V I/O (SSTL_2 compatible)·Differential clock in puts (CK and CK#)·Commands entered on each positive CK edge·Internal pipelined double-data-rate (DDR) ar chi te...
W3E32M72S-XSBX: Features: ·Data rate = 200, 250, 266, 333Mbs·Package:• 208 Plastic Ball Grid Array (PBGA), 16 x 22mm·2.5V ±0.2V core power supply·2.5V I/O (SSTL_2 compatible)·Differential clock in puts (CK an...
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Features: ·Data rate = 200, 250, 266, 333Mbs ·Package:-219 Plastic Ball Grid Array (PBGA), 32 x 25...
Features: DDR SDRAM rate = 200, 250, 266, 333Mb/sPackage:• 219 Plastic Ball Grid Array (PBGA...
·Data rate = 200, 250, 266, 333Mbs
·Package:
• 208 Plastic Ball Grid Array (PBGA), 16 x 22mm
·2.5V ±0.2V core power supply
·2.5V I/O (SSTL_2 compatible)
·Differential clock in puts (CK and CK#)
·Commands entered on each positive CK edge
·Internal pipelined double-data-rate (DDR) ar chi tec ture; two data accesses per clock cy cle
·Programmable Burst length: 2,4 or 8
·Bidirectional data strobe (DQS) transmitted/ re ceived with data, i.e., source-syn chro nous data capture (one per byte)
·DQS edge-aligned with data for READs; centeraligned with data for WRITEs
·DLL to align DQ and DQS transitions with CK
·Four internal banks for concurrent operation
·Data mask (DM) pins for masking write data (one per byte)
·Programmable IOL/IOH option
·Auto precharge option
·Auto Refresh and Self Refresh Modes
·Commercial, Industrial and Military TemperatureRang es
·Organized as 32M x 72
·Weight: W3E32M72S-XSBX - 2.5 grams typical
Parameter |
Unit | |
Voltage on VCC, VCCQ Supply relative to Vss |
-1 to 3.6 |
V |
Voltage on I/O pins relative to Vss |
-0.5V to VCCQ +0.5V |
V |
Operating Temperature TA (Mil) |
-55 to +125 |
|
Operating Temperature TA (Ind) |
-40 to +85 |
|
Storage Temperature, Plastic |
-55 to +125 |
|
Maximum Junction Temperature |
125 |
NOTE: Stress greater than those listed under "Absolute Maximum Ratings" may cause per ma nent damage to the device. This is a stress rating only and func tion al op er a tion of the device at these or any other conditions greater than those in di cat ed in the operational sections of this specifi cation is not implied. Exposure to ab so lute maximum rating con di tions for extended periods may affect reliability.
The 256MByte (2Gb) DDR SDRAM W3E32M72S-XSBX is a high-speed CMOS, dy nam ic ran dom-access, memory using 5 chips containing 536,870,912 bits. Each chip is internally configured as a quad-bank DRAM.
The 256MB DDR SDRAM W3E32M72S-XSBX uses a double data rate ar chi tec ture to achieve high-speed operation. The double data rate ar chi tec ture is essentially a 2n-prefetcharchitecture with an in ter face designed to transfer two data words per clock cycle at the I/O pins. A single read or write access for the 256MB DDR SDRAM effectively consists of a single 2n-bit wide, one-clock-cycle data tansfer at the internal DRAM core and two cor re spond ing n-bit wide, one-half-clock-cycle data transfers at the I/O pins.
A bi-directional data strobe (DQS) W3E32M72S-XSBX is transmitted externally, along with data, for use in data capture at the receiver.strobe transmitted by the DDR SDRAM during READs and by the memory contoller during WRITEs. DQS is edge-aligned with data for READs and center-aligned with data for WRITEs. Each chip has two data strobes, one for the lower byte and one for the upper byte.
The 256MB DDR SDRAM W3E32M72S-XSBX operates from a differential clock (CK and CK#); the crossing of CK going HIGH and CK# going LOW will be referred to as the positive edge of CK. Com mands (ad dress and control signals) are registered at every positive edge of CK. Input data is registered on both edg es of DQS, and out put data is ref er ence