TQHBT3

Features: • 2 and 3-um emitter widths• >22 dB MAG @ 6 GHz; with 3-um emitters• Amplifier Ruggedness: VSWR 70:1 @ 5 V supply• High Linearity in PA applications• InGaP Emitter Process for High Reliability and Thermal Stability• Base Etch Stop for UniformityR...

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SeekIC No. : 004527896 Detail

TQHBT3: Features: • 2 and 3-um emitter widths• >22 dB MAG @ 6 GHz; with 3-um emitters• Amplifier Ruggedness: VSWR 70:1 @ 5 V supply• High Linearity in PA applications• InGaP...

floor Price/Ceiling Price

Part Number:
TQHBT3
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/1/11

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Product Details

Description



Features:

• 2 and 3-um emitter widths
• >22 dB MAG @ 6 GHz; with 3-um emitters
• Amplifier Ruggedness: VSWR 70:1
  @ 5 V supply
• High Linearity in PA applications
• InGaP Emitter Process for High Reliability
  and Thermal Stability
• Base Etch Stop for Uniformity
• MOCVD Epitaxy
• High Density Interconnects;
• 2 Global, 1 Local
• Over 6 m Total Thickness
• Dielectric Encapsulated Metals
• Thick Metal Interconnects:
• Enhanced Thermal Management
• Minimum Die Size
• Effective Base Ballasting for Maximum Gain
• 150 mm Wafers
• High-Q Passives
• NiCr Thin Film Resistors
• High Value Capacitors & Stacked Capacitors
• Backside Vias Optional
• Validated Models and Design Support



Application

• Power Amplifiers
• Driver Amplifiers
• Wideband, General Purpose Amplifiers



Specifications

HBT Storage Temperature Range -65 to +150 Deg C
HBT Operating Junction Temperature
Range
-55 to +150 Deg C
Junction Current Denstity 20 kA/cm^2
Capacitor 20 V



Description

TriQuint's new TQHBT3 process is a highly reliable InGaP HBT process with three levels of interconnecting metal and state-of-the-art device performance. Thick metal interconnects and high quality passives promote integration. The thick metal interconnects, which promote enhanced thermal management, and high density capacitors keep die sizes small. MOCVD epitaxial processes are utilized to grow the active layers. A carbon-doped Base and InGaP Emitter are utilized for high RF performance consistent with high reliability. Designs utilizing the 3-um emitter width of TQHBT3 have the performance of previous 2-um emitters, but with the reliability and ruggedness associated with wider emitters. Precision NiCr resistors and high value MIM capacitors are included. The three metal layers of TQHBT3 are encapsulated in a high performance dielectric that allows wiring flexibility and plastic packaging simplicity.




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