TLP722

Features: • Cathode−anode voltage: 30V (max)• Current transfer ratio: 0.1% (min)• Input / output isolation voltage: 4000Vrms (min)• Operating temperature range: −55~100• Storage temperature range: −55~125• UL recognized: UL1577, E67349• V...

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SeekIC No. : 004521867 Detail

TLP722: Features: • Cathode−anode voltage: 30V (max)• Current transfer ratio: 0.1% (min)• Input / output isolation voltage: 4000Vrms (min)• Operating temperature range: −...

floor Price/Ceiling Price

Part Number:
TLP722
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/1/11

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Product Details

Description



Features:

• Cathode−anode voltage: 30V (max)
• Current transfer ratio: 0.1% (min)
• Input / output isolation voltage: 4000Vrms (min)
• Operating temperature range: −55~100
• Storage temperature range: −55~125
• UL recognized: UL1577, E67349
• VDE approved: EN60747-5-2



Specifications

Characteristic
Symbol
Rating
Unit
LED Forward current
IF
25
mA
Forward current derating
IF /
−0.45
(Ta 70)
mA /
Pulse forward current
IFP
1
(1s pulse, 1000 pps)
mA
Pulse forward current
IFTP
1
(100s pulse, 1000 pps)
A
Reverse voltage
VR
5
V
Detector Cathode−anode voltage
VKAO
30
V
Anode−cathode voltage
VAKO
0.5
V
Photodiode output current
IPB
100
A
Junction temperature
Tj
125
Storage temperature range
Tstg
−55~125
Operating temperature range
Topr
−55~100
Lead soldering temperature (10 s)
Tsol
260 (10s)
Isolation voltage
BVS
4000
(AC, 1min., R.H. 60%)
Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).



Description

The TOSHIBA TLP722 consists of a photo−diode optically coupled to a gallium arsenide infrared emitting diode in a four lead plastic DIP (DIP4).


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