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TC7MH153FK

Features: • High speed: tpd = 5.0 ns (typ.) (VCC = 5 V)• Low power dissipation: ICC = 4 A (max) (Ta = 25°C)• High noise immunity: VNIH = VNIL = 28% VCC (min)• Power down protection is provided on all inputs.• Balanced propagation delays: tpLH tpHL• Wide operati...

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TC7MH153FK: Features: • High speed: tpd = 5.0 ns (typ.) (VCC = 5 V)• Low power dissipation: ICC = 4 A (max) (Ta = 25°C)• High noise immunity: VNIH = VNIL = 28% VCC (min)• Power down prot...

TC7MH153FK Data Sheet

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Part Number:
TC7MH153FK
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

• High speed: tpd = 5.0 ns (typ.) (VCC = 5 V)
• Low power dissipation: ICC = 4 A (max) (Ta = 25°C)
• High noise immunity: VNIH = VNIL = 28% VCC (min)
• Power down protection is provided on all inputs.
• Balanced propagation delays: tpLH tpHL
• Wide operating voltage range: V CC (opr) = 2~5.5 V
• Pin and function compatible with 74ALS153


Pinout

Connection Diagram


Specifications

Characteristics
Symbol
Rating
Unit
Supply voltage range
VCC
−0.5~7.0
V
DC input voltage
VIN
−0.5~7.0
V
DC output voltage
VOUT
−0.5~VCC + 0.5
V
Input diode current
IIK
−20
mA
Output diode current
IOK
±20
mA
DC output current
IOUT
±25
mA
DC Vcc/ground current
ICC
±50
mA
Power dissipation
PD
180
mW
Storage temperature
Tstg
−65~150
Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction.

Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc)


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