TC1130

Features: ` Full-duplex asynchronous operating modes 8-bit or 9-bit data frames, LSB first Parity bit generation/checking One or two stop bits Baud rate from 4.6875 MBaud to 1.1 Baud (@ 75 MHz clock` Multiprocessor mode for automatic address/data byte detection` Loop-back capability` Half-duplex 8...

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TC1130 Picture
SeekIC No. : 004512999 Detail

TC1130: Features: ` Full-duplex asynchronous operating modes 8-bit or 9-bit data frames, LSB first Parity bit generation/checking One or two stop bits Baud rate from 4.6875 MBaud to 1.1 Baud (@ 75 MHz clock...

floor Price/Ceiling Price

Part Number:
TC1130
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2025/1/12

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Product Details

Description



Features:

` Full-duplex asynchronous operating modes
8-bit or 9-bit data frames, LSB first
Parity bit generation/checking
One or two stop bits
Baud rate from 4.6875 MBaud to 1.1 Baud (@ 75 MHz clock
` Multiprocessor mode for automatic address/data byte detection
` Loop-back capability
` Half-duplex 8-bit synchronous operating mode
Baud rate from 9.375 MBaud to 762.9 Baud (@ 75 MHz cloc
` Support for IrDA data transmission up to 115.2 KBaud maximu
` Double buffered transmitter/receiver
` Interrupt generation
On a transmitter buffer empty condition
On a transmit last bit of a frame condition
On a receiver buffer full condition
On an error condition (frame, parity, overrun error)
` FIFO
8 byte receive FIFO (RXFIFO)
8 byte transmit FIFO (TXFIFO)
Independent control of RXFIFO and TXFIFO
9-bit FIFO data width
Programmable Receive/Transmit Interrupt Trigger Level
Receive and Transmit FIFO filling level indication
Overrun error generation
Underflow error generation
` Master and slave mode operation
Full-duplex or half-duplex operation
Automatic pad control possible
` Flexible data format
Programmable number of data bits: 2 to 16 bit
Programmable shift direction: LSB or MSB shift first
Programmable clock polarity: idle low or high state for the shift clock
Programmable clock/data phase: data shift with leading or trailing edge of the sh
clock
` Baud rate generation minimum at 572.2 Baud (@ 75 MHz module clock)
` Interrupt generation
On a transmitter empty condition
On a receiver full condition
On an error condition (receive, phase, baud rate, transmit error)
` Four-pin interface
` Flexible SSC pin configuration
` Up to eight slave select inputs in slave mode
` Up to eight programmable slave select outputs SLSO in master mode
Automatic SLSO generation with programmable timing
Programmable active level and enable control
` 4-stage receive FIFO (RXFIFO) and 4-stage transmit FIFO (TXFIFO)
Independent control of RXFIFO and TXFIFO
2 to 16 bit FIFO data width
Programmable receive/transmit interrupt trigger level
Receive and transmit FIFO filling level indication
Overrun error generation
Underflow error generation




Pinout

  Connection Diagram


Specifications

Parameter
Symbol
Limit Values
Unit
Notes
min.
max.
Ambient temperature
TA
-40
85
under bias
Storage temperature
TST
-65
150
Junction temperature
TJ
-40
125
under bias
Voltage at 1.5V power supply
pins with respect to VSS1)
VDDC
0.5
1.7
V
Voltage at 3.3V power supply
pins with respect to VSS2)
VDDP
0.5
4.0
V
Voltage on any pin with respect (VSS2)
VIN
0.5
4.0
V
Voltage on Oscillator Supply pins with respect to ground (VSS )
IIN
10
10
V
Absolute sum of all input currents
during overload condition
IIN
|100|
V
3)
CPU & LMB Bus Frequency
fsys
150
MHz
3)
FPI Bus Frequency
f
FPI
100
MHz
Power dissipation
PD
tbd
W


1)Applicable for VDD  and VDDOSC.
2)Applicable for VDDP  and VDDOSC3 .
The maximum voltage difference must not exceed 4.0V in any case (i.e.Supply Voltage = 4.0V and Input Voltage = -0.5V is not allowed).
3)Restricted life time: TBD
Note:
Stresses above those  listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

During absolute maximum rating overload conditions (VIN > VDD  or VIN < VSS ) the voltage on VDD  pins with respect to ground (VSS ) must not exceed the value defined by the absolute maximum ratings.




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