Features: The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device's ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be applied from gate to souce. In this respect the 25V Zener voltage is appropiate...
STU10NC70ZI: Features: The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device's ESD capability, but also to make them safely absorb possible voltage transients that...
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Features: The built-in back-to-back Zener diodes have specifically been designed to enhance not on...
The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device's ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be applied from gate to souce. In this respect the 25V Zener voltage is appropiate to achieve an efficient and cost-effective intervention to protect the device's integrity. These integrated Zener diodes thus avoid the usage of external components.
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Symbol
|
Parameter | Value | Unit | |
STU10NC70Z | STU10NC70ZI | |||
VDS |
Drain-source Voltage (VGS = 0) |
700 |
V | |
VDGR |
Drain- gate Voltage (RGS = 20 k) |
700 |
V | |
VGS |
Gate-Source Voltage |
±25 |
V | |
ID |
Drain Current (continuous) at Tc = 25 |
904 | 9.4(*) |
A |
ID |
Drain Current (continuous) at Tc = 100 |
5.9 | 5.9(*) |
A |
IDM(1) |
Drain Current (pulsed) |
37.6 |
37.6(*) |
A |
PTOT |
Total Dissipation at Tc = 25 |
160 |
55 |
W |
Derating Factor |
1.28 |
0.44 |
W/ | |
IGS |
Gate-source Current |
±50 |
mA | |
VESD(G-S) |
Gate source ESD(HBM-C=100pF, R=15K) |
4 |
KV | |
dv/dt(`) |
Peak Diode Recovery voltage slope |
3 |
V/ns | |
VISO | Insulation Winthstand Voltage (DC) | -- | 2000 | V |
Tstg |
Storage Temperature |
-65 to 150 |
||
Tj |
Max. Operating Junction Temperature |
150 |
The third generation of MESH OVERLAY™ Power MOSFETs STU10NC70ZI for very high voltage exhibits unsurpassed on-resistance per unit area while integrating back-to-back Zener diodes between gate and source. Such arrangement gives extra ESD capability with higher ruggedness performance as requested by a large variety of single-switch applications.