Features: Extended operating voltage 2.7V 5.5V
400 KHz clock frequency (F) at 2.7V - 5.5V
200A active current typical
10A standby current typical
1A standby current typical (L)
0.1A standby current typical (LZ)
IIC compatible interface
Provides bi-directional data transfer protocol
Schmitt trigger inputs
Sixteen byte page write mode
Minimizes total write time per byte
Self timed write cycle
Typical write cycle time of 6ms
Hardware Write Protect for upper half (NM24C05 only)
Endurance: 1,000,000 data changes
Data retention greater than 40 years
Packages available: 8-pin DIP, 8-pin SO, and 8-pin TSSOP
Available in three temperature ranges
- Commercial: 0° to +70°C
- Extended (E): -40° to +85C
- Automotive (V): -40° to +125°CPinoutSpecificationsAmbient Storage Temperature 65 to +150
All Input or Output Voltages
with Respect to Ground 6.5V to 0.3V
Lead Temperature
(Soldering, 10 seconds) +300
ESD Rating 2000V min.DescriptionThe NM24C04/05 devices are 4096 bits of CMOS non-volatile electrically erasable memory. These devices conform to all specifications in the Standard IIC 2-wire protocol and are designed to minimize device pin count, and simplify PC board layout requirements.
The upper half (upper 2Kbit) of the memory of the NM24C05 can be write protected by connecting the WP pin to V
CC. This section of memory then becomes unalterable unless WP is switched to VSS.
This communications protocol of NM24C04 uses CLOCK (SCL) and DATA I/O (SDA) lines to synchronously clock data between the master (for example a microprocessor) and the slave EEPROM device(s). The Standard IIC protocol allows for a maximum of 16K of EEPROM memory which is supported by the Fairchild family in
2K, 4K, 8K, and 16K devices, allowing the user to configure the memory ofNM24C04 as the application requires with any combination of EEPROMs. In order to implement higher EEPROM memory densities on the IIC bus, the Extended IIC protocol must be used. (Refer to the NM24C32 or NM24C65 datasheets for more information.)
Fairchild EEPROMs NM24C04 are designed and tested for applications requiring high endurance, high reliability and low power consumption.