Features: • SUPER LOW NOISE FIGURE: NF = 0.35 dB TYP at f = 4 GHz• HIGH ASSOCIATED GAIN: GA = 15.0 dB TYP at f = 4 GHz• GATE LENGTH = LG = 0.3 m• GATE WIDTH = WG = 280 m• HERMETIC SEALED CERAMIC PACKAGE• HIGH RELIABILITYApplication• BEST SUITED FOR LOW NOI...
NE23383B: Features: • SUPER LOW NOISE FIGURE: NF = 0.35 dB TYP at f = 4 GHz• HIGH ASSOCIATED GAIN: GA = 15.0 dB TYP at f = 4 GHz• GATE LENGTH = LG = 0.3 m• GATE WIDTH = WG = 280 m̶...
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• SUPER LOW NOISE FIGURE:
NF = 0.35 dB TYP at f = 4 GHz
• HIGH ASSOCIATED GAIN:
GA = 15.0 dB TYP at f = 4 GHz
• GATE LENGTH = LG = 0.3 m
• GATE WIDTH = WG = 280 m
• HERMETIC SEALED CERAMIC PACKAGE
• HIGH RELIABILITY
SYMBOLS | PARAMETERS | UNITS | RATINGS |
VDS | Drain to Source Voltage | V | 4.0 |
VGS | Gate to Source Voltage | V | 4.0 |
ID | Drain Current | mA | IDSS |
PTOT | Total Power Dissipation | mW | 165 |
TCH | Channel Temperature | 175 | |
TSTG | Storage Temperature | -65 to +175 |
The NE23383B is a heterojunction FET that utilizes the heterojunction to create high mobility electrons. The device features mushroom shaped gate for decreased gate resistance and improved power handling capabilities. The mushroom gate structure also results in low noise figure and high associated gain. The NE23383B is housed in a rugged hermetically sealed metal ceramic stripline package selected for industrial and space applications.
NEC's NE23383B stringent quality assurance and test procedures assure the highest reliability and performance.