MOSFET N-Ch LL FET Enhancement Mode
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Transistor Polarity : | N-Channel | Drain-Source Breakdown Voltage : | 50 V | ||
Gate-Source Breakdown Voltage : | +/- 16 V | Continuous Drain Current : | 75 A | ||
Resistance Drain-Source RDS (on) : | 0.0085 Ohms | Configuration : | Single | ||
Maximum Operating Temperature : | + 175 C | Mounting Style : | SMD/SMT | ||
Package / Case : | TO-263AB | Packaging : | Reel |
Symbol | Parameter |
NDP7052L |
NDB7052L |
Units |
VDSS | Drain-Source Voltage |
50 |
V | |
VDGR | Drain-Gate Voltage (RGS 1 M) |
50 |
V | |
VGSS | Gate-Source Voltage - Continuous - Nonrepetitive (tP < 50 µs) |
±16 |
V | |
±25 | ||||
ID | Drain Current - Continuous - Pulsed |
75 |
A | |
225 | ||||
PD | Total Power Dissipation @ TC = 25°C Derate above 25°C |
150 |
W | |
1 |
W/ | |||
TJ,TSTG | Operating and Storage Temperature Range |
-65 to 175 |
These logic level N-Channel enhancement mode power field effect transistors NDB7052L are produced using Fairchild's proprietary, high cell density, DMOS technology. This very high density process has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulses in the avalanche and commutation modes. NDB7052L is particularly suited for low voltage applications such as automotive, DC/DC converters, PWM motor controls, and other battery powered circuits where fast switching, low in-line power loss, and resistance to transients are needed.