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MT4LDT464H

Features: • JEDEC pinout in a 144-pin, small-outline, dual inline memory module (SODIMM)• 32MB (4 Meg x 64) and 64MB (8 Meg x 64)• High-performance CMOS silicon-gate process• Single +3.3V ±0.3V power supply• All inputs, outputs and clocks are TTL-compatible• 4,0...

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SeekIC No. : 004429921 Detail

MT4LDT464H: Features: • JEDEC pinout in a 144-pin, small-outline, dual inline memory module (SODIMM)• 32MB (4 Meg x 64) and 64MB (8 Meg x 64)• High-performance CMOS silicon-gate process•...

MT4LDT464H Data Sheet

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Part Number:
MT4LDT464H
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Product Details

Description



Features:

• JEDEC pinout in a 144-pin, small-outline, dual inline memory module (SODIMM)
• 32MB (4 Meg x 64) and 64MB (8 Meg x 64)
• High-performance CMOS silicon-gate process
• Single +3.3V ±0.3V power supply
• All inputs, outputs and clocks are TTL-compatible
• 4,096-cycle CAS#-BEFORE-RAS# (CBR) refresh distributed across 64ms
• FAST PAGE MODE (FPM) or Extended Data-Out (EDO) PAGE MODE access cycles
• Optional Self Refresh Mode (S)
• Serial presence-detect (SPD)


Specifications

Voltage on VDD Supply
   Relative to VSS ...........................................-1V to +4.6V
Voltage on Inputs or I/O Pins
   Relative to VSS ............................................-1V to +4.6V
Operating Temperature, TA (ambient) ...... 0°C to +70°C
Storage Temperature (plastic) ............ -55°C to +125°C
Power Dissipation (32MB) ........................................... 4W
Power Dissipation (64MB) ........................................... 8W

*Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to
  the device. This is a stress rating only, and functional operation of the device at these or any other conditions
  above those indicated in the operational sections of this specification is not implied. Exposure to absolute
  maximum rating conditions for extended periods may affect reliability.


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