Features: · Rugged polysilicon gate cell structure· high current handling capability, latch-proof· Hermetically sealed, surface mount power package· Low package inductance· Very low thermal resistance· Reverse polarity available upon request: MSAH(G)60F60B· high frequency IGBT, low switching losse...
MSAHX60F60A: Features: · Rugged polysilicon gate cell structure· high current handling capability, latch-proof· Hermetically sealed, surface mount power package· Low package inductance· Very low thermal resistan...
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Features: · Rugged polysilicon gate cell structure· high current handling capability, latch-proof·...
Features: · Rugged polysilicon gate cell structure· high current handling capability, latch-proof·...
DESCRIPTION | SYMBOL | MAX. | UNIT |
Collector-to-Emitter Breakdown Voltage (Gate Shorted to Emitter) @ TJ25°C |
BVCES | 600 | Volts |
Collector-to-Gate Breakdown Voltage @ TJ 25°C, RGS= 1 W | BVCGR | 600 | Volts |
Continuous Gate-to-Emitter Voltage | VGES | +/-20 | Volts |
Transient Gate-to-Emitter Voltage | VGEM | +/-30 | Volts |
Continuous Collector Current Tj= 25°C Tj=90°C |
IC25 IC90 |
60 32 |
Amps |
Peak Collector Current, pulse width limited by Tjmax, | ICM | 120 | Amps |
Safe Operating Area (RBSOA) @ VGE= 15V, L= 100mH (clamped inductive load), RG= 4.7W, Tj= 125°C, VCE= 0.8 * VCES |
Imax | 64 | Amps |
Power Dissipation | PD | 300 | Watts |
Junction Temperature Range | Tj | -55 to +150 | °C |
Storage Temperature Range | Tstg | -55 to +150 | °C |
Continuous Source Current (Body Diode, MSAHX60F60A only) | IS | 32 | Amps |
Pulse Source Current (Body Diode, MSAHX60F60A only) | ISM | 100 | Amps |
Thermal Resistance, Junction to Case | JC | 0.4 | °C/W |