Features: • Small Size• Passivated Die for Reliability and Uniformity• Low Level Triggering and Holding Characteristics• Surface Mount Lead Form − Case 369C• Epoxy Meets UL 94, V−0 @ 0.125 in• ESD Ratings: Human Body Model, 3B > 8000 V Machine Model,...
MCR716: Features: • Small Size• Passivated Die for Reliability and Uniformity• Low Level Triggering and Holding Characteristics• Surface Mount Lead Form − Case 369C• Epox...
SeekIC Buyer Protection PLUS - newly updated for 2013!
268 Transactions
All payment methods are secure and covered by SeekIC Buyer Protection PLUS.
Parameter |
Symbol |
Value |
Unit |
Peak Repetitive Off−State Voltage (Note 1) (TJ = −40 to 110°C, Sine Wave, 50 to 60 Hz, Gate Open) MCR716 MCR718 |
VDRM VRRM |
400 600 |
Volts |
On−State RMS Current (180° Conduction Angles; TC = 90°C) |
IT(RMS) |
4.0 |
A |
Average On−State Current (180° Conduction Angles; TC = 90°C) |
IT(AV) | 2.6 | A |
Peak Non-Repetitive Surge Current (1/2 Cycle, Sine Wave 60 Hz, TJ = 110°C) |
ITSM |
25 |
A |
Circuit Fusing Consideration (t = 8.3 ms) |
I2t |
2.6 |
A2sec |
Peak Gate Power (Pulse Width 1.0 s, TC = 80°C) |
PGM |
0.5 |
Watts |
Average Gate Power (t = 8.3 ms, TC = 80°C) |
PG(AV) |
0.1 |
Watts |
Peak Gate Current (Pulse Width 3 1.0 ms, TC = 80°C) |
IGM |
0.2 |
A |
Operating Junction Temperature Range |
TJ |
40 to +110 |
°C |
Storage Temperature Range |
Tstg |
40 to +150 |
°C |
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected.
1. VDRM and VRRM for all types can be applied on a continuous basis. Ratings apply for zero or negative gate voltage; positive gate voltage shall not be applied concurrent with negative potential on the anode. Blocking voltages shall not be tested with a constant current source such that the voltage ratings of the devices are exceeded.