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M58LW032D

Features: ` WIDE x8 or x16 DATA BUS for HIGHBANDWIDTH` SUPPLY VOLTAGE VDD = VDDQ = 2.7 to 3.6V for Program, Erase nd Read operations` ACCESS TIME Random Read 90ns,110ns Page Mode Read 90ns/25ns, 110ns/25ns` PROGRAMMING TIME 16 Word Write Buffer 12ms Word effective programming time` 32 UNIFORM 64 K...

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SeekIC No. : 004406120 Detail

M58LW032D: Features: ` WIDE x8 or x16 DATA BUS for HIGHBANDWIDTH` SUPPLY VOLTAGE VDD = VDDQ = 2.7 to 3.6V for Program, Erase nd Read operations` ACCESS TIME Random Read 90ns,110ns Page Mode Read 90ns/25ns, 110...

M58LW032D Data Sheet

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Part Number:
M58LW032D
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/27

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Product Details

Description



Features:

` WIDE x8 or x16 DATA BUS for HIGH
BANDWIDTH
` SUPPLY VOLTAGE
VDD = VDDQ = 2.7 to 3.6V for Program, Erase nd Read operations
` ACCESS TIME
Random Read 90ns,110ns
Page Mode Read 90ns/25ns, 110ns/25ns
` PROGRAMMING TIME
16 Word Write Buffer
12ms Word effective programming time
` 32 UNIFORM 64 KWord/128KByte MEMORYBLOCKS
` ENHANCED SECURITY
Block Protection/ Unprotection
VPEN signal for Program Erase Enable
128 bit Protection Register with 64 bit Unique ode in OTP area
` PROGRAM and ERASE SUSPEND
` 128 bit PROTECTION REGISTER
` COMMON FLASH INTERFACE
` 100, 000 PROGRAM/ERASE CYCLES per LOCK
` ELECTRONIC SIGNATURE
Manufacturer Code: 0020h
Device Code M58LW032D: 0016h


Pinout

Connection Diagram


Specifications

Symbol
Parameter
Value
Unit
Min
Max
TBIAS
Temperature Under Bias
40
125
°C
TSTG
Storage Temperature
55
150
°C
VIO
Input or Output Voltage
0.6
VDDQ +0.6
V
VDD, VDDQ
Supply Voltage
0.6
5.0
V
IOSC
Output Short-circuit Current
100(1)
mA



Description

Stressing the device above the ratings listed in Table 11, Absolute Maximum Ratings, may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality documents.




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