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M58LW032C

Features: ` WIDE x16 DATA BUS for HIGH BANDWIDTH` SUPPLY VOLTAGE VDD = 2.7 to 3.6V core supply voltage for Program, rase and Read operations VDDQ = 1.8 to VDD for I/O Buffers` SYNCHRONOUS/ASYNCHRONOUS READ Synchronous Burst read Asynchronous Random Read Asynchronous Address Latch Controlled ead Pa...

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SeekIC No. : 004406118 Detail

M58LW032C: Features: ` WIDE x16 DATA BUS for HIGH BANDWIDTH` SUPPLY VOLTAGE VDD = 2.7 to 3.6V core supply voltage for Program, rase and Read operations VDDQ = 1.8 to VDD for I/O Buffers` SYNCHRONOUS/ASYNCHRONO...

M58LW032C Data Sheet

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Part Number:
M58LW032C
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/27

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Product Details

Description



Features:

` WIDE x16 DATA BUS for HIGH BANDWIDTH
` SUPPLY VOLTAGE
VDD = 2.7 to 3.6V core supply voltage for Program, rase and Read operations
VDDQ = 1.8 to VDD for I/O Buffers
` SYNCHRONOUS/ASYNCHRONOUS READ
Synchronous Burst read
Asynchronous Random Read
Asynchronous Address Latch Controlled ead
Page Read
` ACCESS TIME
Synchronous Burst Read up to 56MHz
Asynchronous Page Mode Read 90/25ns, 10/25ns
Random Read 90ns, 110ns
` PROGRAMMING TIME
16 Word Write Buffer
12s Word effective programming time
` 32 UNIFORM 64 KWord MEMORY BLOCKS
` ENHANCED SECURITY
Block Protection/ Unprotection
Smart Protection: irreversible block locking ystem
VPEN signal for Program Erase Enable
128 bit Protection Register with 64 bit Unique ode in OTP area
` PROGRAM and ERASE SUSPEND
` COMMON FLASH INTERFACE
` 100,000 PROGRAM/ERASE CYCLES per LOCK
` ELECTRONIC SIGNATURE
Manufacturer Code: 0020h
Device Code M58LW032C : 8822h


Pinout

Connection Diagram


Specifications

Symbol
Parameter
Value
Unit
Min
Max
TBIAS
Temperature Under Bias
40
125
°C
TSTG
Storage Temperature
55
150
°C
VIO
Input or Output Voltage
0.6
VDDQ +0.6
V
VDD, VDDQ
Supply Voltage
0.6
5.0
V



Description

M58LW032C Stressing the device above the ratings listed in Table 1, Absolute Maximum Ratings, may cause ermanent damage to the device. These are tress ratings only and operation of the device at hese or any other conditions above those indicated n the Operating sections of this specification isnot implied. Exposure to Absolute Maximum Rating onditions for extended periods may affect device eliability. Refer also to the TMicroelectronics SURE Program and other relevant uality documents.




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