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M29W040B

Features: ` SINGLE 2.7 to 3.6V SUPPLY VOLTAGE for PROGRAM, ERASE and READ OPERATIONS` ACCESS TIME: 55ns` PROGRAMMING TIME 10ms per Byte typical` 8 UNIFORM 64 Kbytes MEMORY BLOCKS` PROGRAM/ERASE CONTROLLER Embedded Byte Program algorithm Embedded Multi-Block/Chip Erase algorithm Status Register Pol...

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SeekIC No. : 004404412 Detail

M29W040B: Features: ` SINGLE 2.7 to 3.6V SUPPLY VOLTAGE for PROGRAM, ERASE and READ OPERATIONS` ACCESS TIME: 55ns` PROGRAMMING TIME 10ms per Byte typical` 8 UNIFORM 64 Kbytes MEMORY BLOCKS` PROGRAM/ERASE CONT...

M29W040B Data Sheet

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Part Number:
M29W040B
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/27

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Product Details

Description



Features:

` SINGLE 2.7 to 3.6V SUPPLY VOLTAGE for PROGRAM, ERASE and READ OPERATIONS
` ACCESS TIME: 55ns
` PROGRAMMING TIME
10ms per Byte typical
` 8 UNIFORM 64 Kbytes MEMORY BLOCKS
` PROGRAM/ERASE CONTROLLER
Embedded Byte Program algorithm
Embedded Multi-Block/Chip Erase algorithm
Status Register Polling and Toggle Bits
` ERASE SUSPEND and RESUME MODES
Read and Program another Block during Erase Suspend
` UNLOCK BYPASS PROGRAM COMMAND
Faster Production/Batch Programming
`LOW POWER CONSUMPTION
Standby and Automatic Standby
` 100,000 PROGRAM/ERASE CYCLES per BLOCK
` 20 YEARS DATA RETENTION
Defectivity below 1 ppm/year
` ELECTRONIC SIGNATURE
Manufacturer Code: 20h
Device Code: E3h


Pinout

Connection Diagram


Specifications

Symbol Parameter Value Unit
TA Ambient Operating Temperature (Temperature Range Option 1) 0 to 70 °C
TA Ambient Operating Temperature (Temperature Range Option 6) 40 to 85 °C
TBIAS Temperature Under Bias 50 to 125 °C
TSTG Storage Temperature 65 to 150 °C
VIO(2) Input or Output Voltage 0.6 to 4 V
VCC Supply Voltage 0.6 to 4 V
VID Identification Voltage 0.6 to 13.5 V

Note: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality documents.
2. Minimum Voltage may undershoot to 2V during transition and for less than 20ns during transitions.




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