Features: • 2.5V + 0.1V power supply for device operation• 1.8V + 0.1V power supply for I/O interface• On-Die Termination for all inputs except CKE,ZQ• Output Driver Strength adjustment by EMRS• SSTL_18 compatible inputs/outputs• 4 banks operation• MRS cyc...
K4N26323AE-GC: Features: • 2.5V + 0.1V power supply for device operation• 1.8V + 0.1V power supply for I/O interface• On-Die Termination for all inputs except CKE,ZQ• Output Driver Strength...
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Parameter | Symbol | Value | Unit |
Voltage on any pin relative to Vss | VIN, VOUT | -0.5 ~ 3.6 | V |
Voltage on VDD supply relative to Vss | VDD | -1.0 ~ 3.6 | V |
Voltage on VDDQ supply relative to Vss | VDDQ | -0.5 ~ 3.6 | V |
Storage temperature | TSTG | -55 ~ +150 | °C |
Power dissipation | PD | 4.5 | W |
Short circuit current | IOS | 50 | mA |
Note :
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
The 4Mx32 GDDR2 is 134,217,728 bits of hyper synchronous data rate Dynamic RAM organized as 4 x 1,048,976 words by 32 bits, fabricated with SAMSUNG's high performance CMOS technology. Synchronous features with Data Strobe allow extremely high performance up to 4GB/s/chip. I/O transactions are possible on both edges of the clock cycle. Range of operating frequencies, and programmable latencies allow the device to be useful for a variety of high performance memory system applications.