K4M563233D-M(E)E/N/I/P

Features: • 3.0V & 3.3V power supply• LVCMOS compatible with multiplexed address• Four banks operation• MRS cycle with address key programs-. CAS latency (1, 2 & 3)-. Burst length (1, 2, 4, 8 & Full page)-. Burst type (Sequential & Interleave)• All inp...

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SeekIC No. : 004382828 Detail

K4M563233D-M(E)E/N/I/P: Features: • 3.0V & 3.3V power supply• LVCMOS compatible with multiplexed address• Four banks operation• MRS cycle with address key programs-. CAS latency (1, 2 & 3)-....

floor Price/Ceiling Price

Part Number:
K4M563233D-M(E)E/N/I/P
Supply Ability:
5000

Price Break

  • Qty
  • 1~5000
  • Unit Price
  • Negotiable
  • Processing time
  • 15 Days
Total Cost: $ 0.00

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Upload time: 2024/11/23

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Product Details

Description



Features:

• 3.0V & 3.3V power supply
• LVCMOS compatible with multiplexed address
• Four banks operation
• MRS cycle with address key programs
-. CAS latency (1, 2 & 3)
-. Burst length (1, 2, 4, 8 & Full page)
-. Burst type (Sequential & Interleave)
• All inputs are sampled at the positive going edge of the system clock
• Burst read single-bit write operation
• DQM for masking
• Auto & self refresh
• 64ms refresh period (4K cycle).
• Extended Temperature Operation (-25°C ~ 85°C).
• Inderstrial Temperature Operation (-40°C ~ 85°C).
• 90Balls DDP FBGA(-MXXX -Pb, -EXXX -Pb Free).




Specifications

Parameter Symbol Value Unit
Voltage on any pin relative to Vss VIN, VOUT -1.0 ~ 4.6 V
Voltage on VDD supply relative to Vss VDD ,VDDQ -1.0 ~ 4.6 V
Storage temperature TSTG -55 ~ +150 °C
Power dissipation PD 1.0 W
Short circuit current IOS 50 mA

Note :
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.




Description

The K4M283233D is 268,435,456 bits synchronous high data rate Dynamic RAM organized as 4 x 2,097,152 words by 32 bits, fabricated with SAMSUNG¢s high performance CMOS technology. Synchronous design allows precise cycle control with the use of system clock and I/O transactions are possible on every clock cycle. Range of operating frequencies, programmable burst lengths and programmable latencies allow the same device to be useful for a variety of high bandwidth and high performance memory system applications.




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